Abstract: A semiconductor package includes: a first semiconductor chip including a first substrate and a first through electrode passing through the first substrate, wherein the first substrate has a first active surface and a first non-active surface; a chip structure including a plurality of second semiconductor chips stacked on the first semiconductor chip, wherein each second semiconductor chip includes a second substrate and a second through electrode passing through the second substrate; and a third semiconductor chip disposed on the chip structure, and including a third substrate, wherein the first substrate has a first width and a first thickness, wherein the second substrate has a second width and a second thickness, and the third substrate has a third width and a third thickness, wherein the third thickness is thicker than the second thickness, and the third width is greater than the second width.

Abstract: An ultrasound diagnostic apparatus in accordance with one aspect of the disclosure includes: a plurality of channels configured to transmit and receive signal with a plurality of transducer elements comprised in a probe; a beamformer configured to perform beamforming a signal received from a preset number of active channel among the plurality of channels; a switch configured to connect the probe and the plurality of channels; and a controller configured to determine a faulty channel among the plurality of channels, compare whether the number of the plurality of channels is greater than or equal to the number of the plurality of transducer elements and control the switch based on the comparison result when the faulty channel is comprised in the active channel.

Abstract: An ultrasound diagnostic apparatus in accordance with one aspect of the disclosure includes: a plurality of channels configured to transmit and receive signal with a plurality of transducer elements comprised in a probe; a beamformer configured to perform beamforming a signal received from a preset number of active channel among the plurality of channels; a switch configured to connect the probe and the plurality of channels; and a controller configured to determine a faulty channel among the plurality of channels, compare whether the number of the plurality of channels is greater than or equal to the number of the plurality of transducer elements and control the switch based on the comparison result when the faulty channel is comprised in the active channel.