Abstract: The present technology includes a memory device and a method of operating the same. The memory device includes a memory block, page buffers connected to memory cells through bit lines and configured to apply a program allowable voltage or a program inhibit voltage to the bit lines, a current measurer configured to output a total current value of the bit lines according to a sensing voltage measured from the bit lines, and a logic circuit configured to control the voltage generator and the page buffers to calculate the number of inhibit cells according to the total current value and omit a verify operation of a program loop or perform the verify operation of the program loop according to the number of the inhibit cells.

Abstract: The present application relates to a method of generating a downlink frame. The method of generating the downlink frame includes: generating a first short sequence and a second short sequence indicating cell group information; generating a first scrambling sequence and a second scrambling sequence determined by the primary synchronization signal; generating a third scrambling sequence determined by the first short sequence and a fourth scrambling sequence determined by the second short sequence; scrambling the short sequences with the respective scrambling sequences; and mapping the secondary synchronization signal that includes the first short sequence scrambled with the first scrambling sequence, the second short sequence scrambled with the second scrambling sequence and the third scrambling sequence, the second short sequence scrambled with the first scrambling sequence and the first short sequence scrambled by the second scrambling sequence and the fourth scrambling sequence to a frequency domain.

Abstract: Provided herein is a memory device for performing a program operation on memory cells. The memory device include a plurality of memory cells configured to store data, a voltage generator configured to apply program voltages to a word line coupled to the plurality of memory cells during a program operation in which the plurality of memory cells are programmed to a plurality of program states, a cell speed determiner configured to determine a program speed of the plurality of memory cells depending on a number of pulses for the program voltages applied to the word line while the program operation is being performed, and a program manager configured to change a condition for remaining program operations depending on the program speed determined by the cell speed determiner.

Abstract: A semiconductor memory device includes a memory cell array, a peripheral circuit, and a control logic. The memory cell array includes a plurality of memory cells. The peripheral circuit performs a program operation on selected memory cells among the plurality of memory cells. The control logic controls the program operation of the peripheral circuit. The program operation includes a plurality of program loops. The control logic is configured to control the peripheral circuit to apply a program voltage to a select word line that is connected to the selected memory cells, apply a first under drive voltage that is determined based on at least one verify voltage to the select word line, and apply the at least one verify voltage to the select word line in each of the plurality of program loops. The first under drive voltage is at a lower voltage level than the at least one verify voltage.

Abstract: A semiconductor memory device includes a memory cell array, a peripheral circuit, and a control logic. The memory cell array includes a plurality of memory cells. The peripheral circuit performs a program operation on selected memory cells among the plurality of memory cells. The control logic controls the program operation of the peripheral circuit. The program operation includes a plurality of program loops. The control logic is configured to control the peripheral circuit to apply a program voltage to a select word line that is connected to the selected memory cells, apply a first under drive voltage that is determined based on at least one verify voltage to the select word line, and apply the at least one verify voltage to the select word line in each of the plurality of program loops. The first under drive voltage is at a lower voltage level than the at least one verify voltage.

Abstract: Provided herein is a memory device for performing a program operation on memory cells. The memory device include a plurality of memory cells configured to store data, a voltage generator configured to apply program voltages to a word line coupled to the plurality of memory cells during a program operation in which the plurality of memory cells are programmed to a plurality of program states, a cell speed determiner configured to determine a program speed of the plurality of memory cells depending on a number of pulses for the program voltages applied to the word line while the program operation is being performed, and a program manager configured to change a condition for remaining program operations depending on the program speed determined by the cell speed determiner.

Abstract: A semiconductor memory device includes a plurality of memory cells electrically coupled to a plurality of word lines and a word line failure detection unit suitable for supplying a test voltage to a test target word line selected from among the plurality of word lines, and for detecting the test voltage transferred from at least one of the plurality of word lines, wherein the at least one of the plurality of word lines does not include the test target word line.

Abstract: A semiconductor memory device includes a plurality of memory cells electrically coupled to a plurality of word lines and a word line failure detection unit suitable for supplying a test voltage to a test target word line selected from among the plurality of word lines, and for detecting the test voltage transferred from at least one of the plurality of word lines, wherein the at least one of the plurality of word lines does not include the test target word line.