Patents by Inventor Seung Hun Baek

Seung Hun Baek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250033471
    Abstract: A non-contact interface device for a vehicle and a method for controlling the same, may display an operation system menu for a driver and passengers to operate various kinds of devices of the vehicle as a hologram, enable a user to operate the displayed operation system menu in a non-contact manner by use of the user's finger or the like, and provide the user with a tactile feedback for a non-contact operation, so that the user can recognize whether to have operated the menu.
    Type: Application
    Filed: November 20, 2023
    Publication date: January 30, 2025
    Applicants: HYUNDAI MOTOR COMPANY, KIA CORPORATION, Korea Institute of Science and Technology
    Inventors: Dong Gu Kim, Jang Hyeon Lee, Dae Sung Kwon, Hyun Soo Kim, Il Seon Yoo, Byung Chul Lee, Seong Hun Cho, Seung Hyub Baek, Min Seok Kim, Soo Young Jung
  • Patent number: 9009861
    Abstract: Provided is a fusion measurement apparatus which increases or maximizes the reliability of a measurement. The fusion measurement apparatus includes an atomic microscope for measuring a surface of a substrate at an atomic level, an electron microscope for measuring the atomic microscope and the substrate, and at least one electrode which distorts the path of a secondary electron on the substrate covered by a cantilever of the atomic microscope so that the secondary electron proceeds to an electron detector of the electron microscope.
    Type: Grant
    Filed: June 24, 2011
    Date of Patent: April 14, 2015
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Byong Chon Park, Ju Youb Lee, Woon Song, Jin Ho Choi, Sang Jung Ahn, Joon Lyou, Won Young Song, Jae Wan Hong, Seung Hun Baek
  • Publication number: 20140130212
    Abstract: Provided is a fusion measurement apparatus which increases or maximizes the reliability of a measurement. The fusion measurement apparatus includes an atomic microscope for measuring a surface of a substrate at an atomic level, an electron microscope for measuring the atomic microscope and the substrate, and at least one electrode which distorts the path of a secondary electron on the substrate covered by a cantilever of the atomic microscope so that the secondary electron proceeds to an electron detector of the electron microscope.
    Type: Application
    Filed: June 24, 2011
    Publication date: May 8, 2014
    Inventors: Byong Chon Park, Ju Youb Lee, Woon Song, Jin Ho Choi, Sang Jung Ahn, Joon Lyou, Won Young Song, Jae Wan Hong, Seung Hun Baek
  • Patent number: D1059250
    Type: Grant
    Filed: March 29, 2022
    Date of Patent: January 28, 2025
    Assignee: Hyundai Mobis Co., Ltd.
    Inventors: Cheon Seop Shin, Sang Il Chung, Ju Yeon Jung, Chi Yun Han, Seung Woo Baek, Sang Hun Yoo