Patents by Inventor Seung Taek Baek

Seung Taek Baek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10436844
    Abstract: A synthetic test circuit for testing a submodule performance in a power compensator includes a submodule test unit which is an object of testing the submodule performance, a current source and a controller. The current source is connected to the submodule test unit to supply a voltage to the submodule test unit such that a charging voltage having a capacity set in the submodule test unit is stored in order to operate the submodule test unit. The controller is configured to perform control to perform a submodule performance test of the submodule test unit using the stored charging voltage.
    Type: Grant
    Filed: August 22, 2017
    Date of Patent: October 8, 2019
    Assignee: LSIS CO., LTD.
    Inventors: Yong Ho Chung, Seung Taek Baek, Young Woo Kim, Jin Hee Lee, Eui Cheol Nho, Jae Hun Jung
  • Publication number: 20180136281
    Abstract: A synthetic test circuit for testing a submodule performance in a power compensator includes a submodule test unit which is an object of testing the submodule performance, a current source and a controller. The current source is connected to the submodule test unit to supply a voltage to the submodule test unit such that a charging voltage having a capacity set in the submodule test unit is stored in order to operate the submodule test unit. The controller is configured to perform control to perform a submodule performance test of the submodule test unit using the stored charging voltage.
    Type: Application
    Filed: August 22, 2017
    Publication date: May 17, 2018
    Applicants: LSIS CO., LTD., Pukyong National University Industry-University Cooperation Foundation
    Inventors: Yong Ho CHUNG, Seung Taek BAEK, Young Woo KIM, Jin Hee LEE, Eui Cheol NHO, Jae Hun JUNG
  • Patent number: 9869728
    Abstract: Embodiments of a synthetic test circuit for a valve performance test of high-voltage direct current (HVDC) are presented. In some embodiments, the synthetic test circuit comprises a resonance circuit configured to comprise a first test valve to test an operation of an inverter mode and a second test valve to test an operation of a rectifier mode. The synthetic test circuit may comprise a power supply (P/S) configured to provide the resonance circuit with an operating voltage. The synthetic test circuit may comprise a direct current/direct current (DC/DC) converter configured to bypass a DC offset current of the resonance circuit. The first test valve may be an inverter unit, which may have a positive DC current offset. Further, the second test valve may be a rectifier unit, which may have a negative DC current offset.
    Type: Grant
    Filed: June 20, 2016
    Date of Patent: January 16, 2018
    Assignee: LSIS CO., LTD
    Inventors: Seung Taek Baek, Eui Cheol Nho, Jae Hun Jung, Jin Hee Lee, Yong Ho Chung
  • Publication number: 20160370437
    Abstract: Embodiments of a synthetic test circuit for a valve performance test of high-voltage direct current (HVDC) are presented. In some embodiments, the synthetic test circuit comprises a resonance circuit configured to comprise a first test valve to test an operation of an inverter mode and a second test valve to test an operation of a rectifier mode. The synthetic test circuit may comprise a power supply (P/S) configured to provide the resonance circuit with an operating voltage. The synthetic test circuit may comprise a direct current/direct current (DC/DC) converter configured to bypass a DC offset current of the resonance circuit. The first test valve may be an inverter unit, which may have a positive DC current offset. Further, the second test valve may be a rectifier unit, which may have a negative DC current offset.
    Type: Application
    Filed: June 20, 2016
    Publication date: December 22, 2016
    Applicant: Pukyong National University Industry-University Cooperation Foundation
    Inventors: Seung Taek BAEK, Eui Cheol NHO, Jae Hun JUNG, Jin Hee LEE, Yong Ho CHUNG
  • Patent number: 9500696
    Abstract: Provided is a synthetic test circuit for synthetic-testing a thyristor valve in high voltage direct current (HVDC). A resonant circuit applies forward DC current, a reverse DC voltage, and a forward DC voltage to synthetic-test the thyristor valve. A current generation unit generates DC current that is above a reference current value to supply the generated DC current into the resonant circuit. A voltage generates unit generating a DC voltage that is above a reference voltage value to supply the generated DC voltage into the resonant circuit. The resonant circuit includes a charging auxiliary valve for charging a gate driver of the thyristor valve.
    Type: Grant
    Filed: July 3, 2014
    Date of Patent: November 22, 2016
    Assignee: LSIS CO., LTD.
    Inventors: Jun Bum Kwon, Teag Sun Jung, Seung Taek Baek, Wook Hwa Lee, Yong Ho Chung
  • Patent number: 9455618
    Abstract: The present disclosure provides a method for controlling a multilevel converter, the method including, detecting modulation state values and current directions of sub-modules, and designating, by one sub-module, an average number of switching for each period of an output waveform, wherein the step of designating the average number of switching includes, grouping the sub-modules according to being in ON state or in OFF state, comparing the number of sub-modules in previous ON state and the number of sub-modules in OFF state to obtain a difference therebetween, and changing a state as much as the difference, comparing a sub-module of ON state in charged state and in discharged state with a sub-module of OFF state, and changing the compared states of sub-modules of ON state and OFF state.
    Type: Grant
    Filed: May 22, 2014
    Date of Patent: September 27, 2016
    Assignees: LSIS CO., LTD., Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Gum Tae Son, Kyeon Hur, Jung Wook Park, Hee Jin Lee, Tae Sik Nam, Yong Ho Chung, Seung Taek Baek, Wook Hwa Lee
  • Patent number: 9331485
    Abstract: Disclosed is a HVDC valve tower. The HVDC valve tower includes cylindrical valve module loading part, a valve module loaded on the valve module loading part, and a crane disposed at a center of the valve module loading part to be rotatable.
    Type: Grant
    Filed: April 17, 2014
    Date of Patent: May 3, 2016
    Assignee: LSIS CO., LTD.
    Inventors: Young Woo Kim, Yong Ho Chung, Wook Hwa Lee, Seung Taek Baek, Teag Sun Jung, Jun Bum Kwon
  • Patent number: 9310421
    Abstract: An apparatus for testing a thyristor valve includes: a current source circuit that provides an electric current when a thyristor valve as a test target is turned on; a voltage source circuit that provides a reverse voltage or a forward voltage when the thyristor valve is turned off; and a first auxiliary valve provided between a connection point between the thyristor valve and the voltage source circuit and the current source circuit, and that insulates the current source circuit from the voltage source circuit to protect the current source circuit from a high voltage of the voltage source circuit.
    Type: Grant
    Filed: May 8, 2013
    Date of Patent: April 12, 2016
    Assignees: LSIS CO., LTD., Corporation Foundation
    Inventors: Seung Taek Baek, Byung Moon Han, Eui Cheol Nho, Yong Ho Chung, Wook Hwa Lee
  • Patent number: 9052726
    Abstract: A method of controlling a multilevel converter is provided. In the method of controlling a multilevel converter according to an embodiment, a sub-module having the maximum voltage and a sub-module having the minimum voltage respectively are extracted from among a plurality of sub-modules. An amount of state variation of each of the plurality of sub-modules is determined. When the amount of state variation is not determined to be 0, a direction of a current flowing through the plurality of sub-modules is detected. A subsequent state of at least one sub-module is determined according to at least one of the amount of the state variation and current direction. Subsequently an arrangement time for sub-module values can be efficiently reduced while the number of the sub-modules increases in the voltage balancing.
    Type: Grant
    Filed: December 28, 2012
    Date of Patent: June 9, 2015
    Assignees: LSIS Co., Ltd., Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Seung Taek Baek, Gum Tae Son, Kyeon Hur, Jung Wook Park, Hee Jin Lee, Yong Ho Chung, Wook Hwa Lee
  • Publication number: 20150102834
    Abstract: Provided is a synthetic test circuit for synthetic-testing a thyristor valve in high voltage direct current (HVDC). A resonant circuit applies forward DC current, a reverse DC voltage, and a forward DC voltage to synthetic-test the thyristor valve. A current generation unit generates DC current that is above a reference current value to supply the generated DC current into the resonant circuit. A voltage generates unit generating a DC voltage that is above a reference voltage value to supply the generated DC voltage into the resonant circuit. The resonant circuit includes a charging auxiliary valve for charging a gate driver of the thyristor valve.
    Type: Application
    Filed: July 3, 2014
    Publication date: April 16, 2015
    Applicant: LSIS CO., LTD.
    Inventors: Jun Bum KWON, Teag Sun JUNG, Seung Taek BAEK, Wook Hwa LEE, Yong Ho CHUNG
  • Publication number: 20140354248
    Abstract: The present disclosure provides a method for controlling a multilevel converter, the method including, detecting modulation state values and current directions of sub-modules, and designating, by one sub-module, an average number of switching for each period of an output waveform, wherein the step of designating the average number of switching includes, grouping the sub-modules according to being in ON state or in OFF state, comparing the number of sub-modules in previous ON state and the number of sub-modules in OFF state to obtain a difference therebetween, and changing a state as much as the difference, comparing a sub-module of ON state in charged state and in discharged state with a sub-module of OFF state, and changing the compared states of sub-modules of ON state and OFF state.
    Type: Application
    Filed: May 22, 2014
    Publication date: December 4, 2014
    Applicants: LSIS CO., LTD., Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Gum Tae SON, Kyeon HUR, Jung Wook PARK, Hee Jin LEE, Tae Sik NAM, Yong Ho CHUNG, Seung Taek BAEK, Wook Hwa LEE
  • Publication number: 20140321095
    Abstract: Disclosed is a HVDC valve tower. The HVDC valve tower includes cylindrical valve module loading part, a valve module loaded on the valve module loading part, and a crane disposed at a center of the valve module loading part to be rotatable.
    Type: Application
    Filed: April 17, 2014
    Publication date: October 30, 2014
    Applicant: LSIS CO., LTD.
    Inventors: Young Woo KIM, YONG HO CHUNG, WOOK HWA LEE, SEUNG TAEK BAEK, TEAG SUN JUNG, JUN BUM KWON
  • Publication number: 20130314111
    Abstract: An apparatus for testing a thyristor valve includes: a current source circuit that provides an electric current when a thyristor valve as a test target is turned on; a voltage source circuit that provides a reverse voltage or a forward voltage when the thyristor valve is turned off; and a first auxiliary valve provided between a connection point between the thyristor valve and the voltage source circuit and the current source circuit, and that insulates the current source circuit from the voltage source circuit to protect the current source circuit from a high voltage of the voltage source circuit.
    Type: Application
    Filed: May 8, 2013
    Publication date: November 28, 2013
    Applicants: Myongji University Industry and Academia Cooperation Foundation, Lsis Co., Ltd.
    Inventors: Seung Taek BAEK, Byung Moon HAN, Eui Cheol NHO, Yong Ho CHUNG, Wook Hwa LEE
  • Patent number: 6865947
    Abstract: A vibration detecting apparatus includes a bobbin having a moving path of desired length in an inner periphery of the bobbin; a core movable along the moving path in the inner periphery of the bobbin by vibration applied from exterior or vibration applied to the bobbin; and a coil wound on an outer periphery of the bobbin, the inductance of which being changed in accordance with the shift of the core.
    Type: Grant
    Filed: March 26, 2002
    Date of Patent: March 15, 2005
    Assignee: LG Electronics Inc.
    Inventor: Seung Taek Baek
  • Patent number: 6832519
    Abstract: A vibration detecting apparatus includes a bobbin having a moving path of desired length in an inner periphery of the bobbin; a core movable along the moving path in the inner periphery of the bobbin by vibration applied from exterior or vibration applied to the bobbin; and a coil wound on an outer periphery of the bobbin, the inductance of which being changed in accordance with the shift of the core.
    Type: Grant
    Filed: April 6, 2004
    Date of Patent: December 21, 2004
    Assignee: LG Electronics Inc.
    Inventor: Seung Taek Baek
  • Publication number: 20040187584
    Abstract: A vibration detecting apparatus includes a bobbin having a moving path of desired length in an inner periphery of the bobbin; a core movable along the moving path in the inner periphery of the bobbin by vibration applied from exterior or vibration applied to the bobbin; and a coil wound on an outer periphery of the bobbin, the inductance of which being changed in accordance with the shift of the core.
    Type: Application
    Filed: April 6, 2004
    Publication date: September 30, 2004
    Applicant: LG Electronics Inc.
    Inventor: Seung Taek Baek
  • Patent number: 6640637
    Abstract: A vibration detecting apparatus includes a bobbin having a moving path of desired length in an inner periphery of the bobbin; a core movable along the moving path in the inner periphery of the bobbin by vibration applied from exterior or vibration applied to the bobbin; and a coil wound on an outer periphery of the bobbin, the inductance of which being changed in accordance with the shift of the core.
    Type: Grant
    Filed: August 29, 2002
    Date of Patent: November 4, 2003
    Assignee: LG Electroncis Inc.
    Inventor: Seung Taek Baek
  • Publication number: 20030015039
    Abstract: A vibration detecting apparatus includes a bobbin having a moving path of desired length in an inner periphery of the bobbin; a core movable along the moving path in the inner periphery of the bobbin by vibration applied from exterior or vibration applied to the bobbin; and a coil wound on an outer periphery of the bobbin, the inductance of which being changed in accordance with the shift of the core.
    Type: Application
    Filed: August 29, 2002
    Publication date: January 23, 2003
    Applicant: LG Electronics Inc.
    Inventor: Seung Taek Baek
  • Patent number: 6470751
    Abstract: A vibration detecting apparatus includes a bobbin having a moving path of desired length in an inner periphery of the bobbin; a core movable along the moving path in the inner periphery of the bobbin by vibration applied from exterior or vibration applied to the bobbin; and a coil wound on an outer periphery of the bobbin, the inductance of which being changed in accordance with the shift of the core.
    Type: Grant
    Filed: February 18, 2000
    Date of Patent: October 29, 2002
    Assignee: LG Electronics Inc.
    Inventor: Seung Taek Baek
  • Publication number: 20020100329
    Abstract: A vibration detecting apparatus includes a bobbin having a moving path of desired length in an inner periphery of the bobbin; a core movable along the moving path in the inner periphery of the bobbin by vibration applied from exterior or vibration applied to the bobbin; and a coil wound on an outer periphery of the bobbin, the inductance of which being changed in accordance with the shift of the core.
    Type: Application
    Filed: March 26, 2002
    Publication date: August 1, 2002
    Applicant: LG Electronics Inc.
    Inventor: Seung Taek Baek