Abstract: An integrated cleaning module of a vehicle sensor includes a washing liquid supply module configured to supply cleaning liquid; and an air supply module connected to the washing liquid supply module and configured to supply air. The air supply module includes a compressor configured to generate compressed air; an air tank in which the compressed air generated by the compressor is stored; and an integrated dispenser configured to be in fluid connection with the washing liquid supply module and the air tank. The integrated dispenser is configured to distribute the cleaning liquid and the compressed air.

Abstract: The present technology includes a storage device including a memory device including a first storage region and a second storage region and a memory controller configured to, in response to a write request in the first storage region from an external host, acquire data stored the first region based on a fail prediction information provided from the memory device and to perform a write operation corresponding to the write request, wherein the first storage region and the second storage region are allocated according to logical addresses of data to be stored in by requests of the external host.

Abstract: The present technology includes a storage device including a memory device including a first storage region and a second storage region and a memory controller configured to, in response to a write request in the first storage region from an external host, acquire data stored the first region based on a fail prediction information provided from the memory device and to perform a write operation corresponding to the write request, wherein the first storage region and the second storage region are allocated according to logical addresses of data to be stored in by requests of the external host.

Abstract: The present technology includes a storage device including a memory device including a first storage region and a second storage region and a memory controller configured to, in response to a write request in the first storage region from an external host, acquire data stored the first region based on a fail prediction information provided from the memory device and to perform a write operation corresponding to the write request, wherein the first storage region and the second storage region are allocated according to logical addresses of data to be stored in by requests of the external host.

Abstract: A data storage device includes a storage including a buffer zone and a data zone and a controller for exchanging data with the storage by allocating at least one zone namespace (ZNS) in the data zone, a ZNS being a data storage region that is physically and logically divided and allocated to each of application programs driven in a host. The controller opens one or more sub buffer zones in the buffer zone, divides write data from the host into one or more segments respectively corresponding to sizes of the one or more sub buffer zones, buffers each of the one or more segments in a corresponding one of the one or more sub buffer zones, opens a ZNS corresponding to a length of the write data in the data zone, and migrates the one or more segments buffered in the sub buffer zones to the opened ZNS.

Abstract: A data storage device includes a storage including a buffer zone and a data zone and a controller for exchanging data with the storage by allocating at least one zone namespace (ZNS) in the data zone, a ZNS being a data storage region that is physically and logically divided and allocated to each of application programs driven in a host. The controller opens one or more sub buffer zones in the buffer zone, divides write data from the host into one or more segments respectively corresponding to sizes of the one or more sub buffer zones, buffers each of the one or more segments in a corresponding one of the one or more sub buffer zones, opens a ZNS corresponding to a length of the write data in the data zone, and migrates the one or more segments buffered in the sub buffer zones to the opened ZNS.

Abstract: A memory system includes a storage medium including a plurality of nonvolatile memory devices grouped into a plurality of groups and a controller configured to manage the storage medium by a unit of a zone block, the controller selecting one nonvolatile memory device from each of the groups and configuring the zone block over the selected nonvolatile memory devices.

Abstract: The present technology includes a storage device including a memory device including a first storage region and a second storage region and a memory controller configured to, in response to a write request in the first storage region from an external host, acquire data stored the first region based on a fail prediction information provided from the memory device and to perform a write operation corresponding to the write request, wherein the first storage region and the second storage region are allocated according to logical addresses of data to be stored in by requests of the external host.

Abstract: The present invention relates to a method for measuring a fracture toughness using an instrumented indentation testing, which measures a load and an indentation depth in real time while applying a load to a specimen by an indenter having a flat punch shape.

Abstract: Disclosed is a microreactor for hydrocarbon reforming, including an end plate, a combustion catalyst plate, a combustion channel plate, a reforming catalyst plate and a reforming channel plate, wherein a plurality of combustion catalyst-filled parts are present in a portion of an entire combustion catalyst plate and a plurality of combustion catalyst-unfilled parts are present in a remaining portion.

Abstract: Disclosed is a microreactor for hydrocarbon reforming, including an end plate, a combustion catalyst plate, a combustion channel plate, a reforming catalyst plate and a reforming channel plate, wherein a plurality of combustion catalyst-filled parts are present in a portion of an entire combustion catalyst plate and a plurality of combustion catalyst-unfilled parts are present in a remaining portion.

Abstract: The present invention discloses a test handler comprising a main body, a stocker including a user tray supplier and a user tray deliverer for loading plurality of user trays carrying the semiconductor device during devices tests, a plurality of test trays, a device loading means for transferring the devices in the user tray of the user tray supplier to the test tray, a first tray inverter changing the horizontal posture of the test tray, a soak chamber preparing a desired test temperature condition, a test chamber accomplishing tests, a de-soak chamber restoring the devices temperature, a second tray inverter inverting to the test tray of a horizontal posture, a device unloading means transferring the semiconductor devices on the test tray. The present invention can double the lot size in unit operation to improve equipment operation ratio. In more, the device loading time and unloading can be reduced so that the number of the devices treated in unit operation can be increased.

Abstract: A test tray insert of a test handler is provided including a housing, a locker, and a stopper, where one end side of the stopper is hinged on the inside of the mounting hole and the other end side of the stopper is protruded to the receiving hole so that the stopper fixes the device. The housing includes a receiving hole for loading a device in the enter of the receiving hole, and a mounting hole, extended from both sides of the receiving hole, including a joint jaw. The housing further includes a base protrusion placed n both ends of the bottom of the receiving hole and a supporting protrusion placed in both sides of the base protrusion.

Abstract: The present invention discloses a test handler comprising a main body, a stocker including a user tray supplier and a user tray deliver for loading plurality of user trays carrying the semiconductor device during devices tests, a plurality of test trays, a device loading means for transferring the devices in the user tray of the user tray supplier to the test tray, a first tray inverter changing the horizontal posture of the test tray, a soak chamber preparing a desired test temperature condition, a test chamber accomplishing tests, a de-soak chamber restoring the devices temperature, a second tray inverter inverting to the test tray of a horizontal posture, a device unloading means transferring the semiconductor devices on the test tray. The present invention can double the lot size in unit operation to improve equipment operation ratio. In more, the device loading time and unloading can be reduced so that the number of the devices treated in unit operation can be increased.

Abstract: A method of numbering an electronic component to be mounted on a printed circuit board (PCB). According to the method, the PCB is divided into a plurality of sections, X-Y coordinate values are allocated to each of the sections, and the allocated coordinate values are printed in the corresponding section. The electronic component number is determined and printed on the PCB in a format of "type of the component--classification of the component--X-Y coordinate values of the corresponding section--serial number of the component".