Patents by Inventor SEUNG BIN AHN

SEUNG BIN AHN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250050783
    Abstract: An apparatus provides information on a distance to empty (DTE) of a vehicle and an information providing method is performed thereby. The apparatus includes a display device configured to display DTE information of a vehicle and a controller configured to control operation of the display device. The controller determines low fuel efficiency-related information and high fuel efficiency-related information based on a current vehicle driving condition. The controller determines a low DTE value and a high DTE value based on the low fuel efficiency-related information, the high fuel efficiency-related information, and a current available battery energy. The controller also determines a current DTE value indicating a real-time DTE and controls operation of the display device to display the low DTE value, the high DTE value, and the current DTE value.
    Type: Application
    Filed: January 16, 2024
    Publication date: February 13, 2025
    Applicants: HYUNDAI MOTOR COMPANY, KIA CORPORATION
    Inventors: Kyeong Soo Song, Jin Hyung Lee, Seung Jae Yoo, Hyun Jong Ha, Jae Yeong Jeong, Eun Bin Kim, Seon Min Kim, Jong Hoon Ahn
  • Patent number: 10481005
    Abstract: A semiconductor substrate measuring apparatus includes a light source unit generating irradiation light including light in a first wavelength band and light in a second wavelength band. An optical unit irradiates the irradiation light on a measurement object and condenses reflected light. A light splitting unit splits the reflected light, condensed in the optical unit, into a first optical path and a second optical path. A first detecting unit is disposed on the first optical path and detects first interference light in the first wavelength band in the reflected light. A second detecting unit is disposed on the second optical path and detects second interference light in the second wavelength band in the reflected light. A controlling unit calculates at least one of a surface shape or a thickness of the measurement object. The controlling unit calculates a temperature of the measurement object.
    Type: Grant
    Filed: October 11, 2018
    Date of Patent: November 19, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Se Jin Oh, Tae Kyun Kang, Yu Sin Kim, Jae Ik Kim, Chan Bin Mo, Doug Yong Sung, Seung Bin Ahn, Kul Inn, Yun Kwang Jeon
  • Publication number: 20190323893
    Abstract: A semiconductor substrate measuring apparatus includes a light source unit generating irradiation light including light in a first wavelength band and light in a second wavelength band. An optical unit irradiates the irradiation light on a measurement object and condenses reflected light. A light splitting unit splits the reflected light, condensed in the optical unit, into a first optical path and a second optical path. A first detecting unit is disposed on the first optical path and detects first interference light in the first wavelength band in the reflected light. A second detecting unit is disposed on the second optical path and detects second interference light in the second wavelength band in the reflected light. A controlling unit calculates at least one of a surface shape or a thickness of the measurement object. The controlling unit calculates a temperature of the measurement object.
    Type: Application
    Filed: October 11, 2018
    Publication date: October 24, 2019
    Inventors: SE JIN OH, TAE KYUN KANG, YU SIN KIM, JAE IK KIM, CHAN BIN MO, DOUG YONG SUNG, SEUNG BIN AHN, KUL INN, YUN KWANG JEON