Patents by Inventor Seunghyeok BACK

Seunghyeok BACK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230289971
    Abstract: The hierarchical occlusion inference method according to the exemplary embodiment of the present disclosure includes: deriving a bounding box feature of the object instance by receiving a region of interest color-depth FPN feature and the object region of interest feature derived from a cluttered scene image including at least one object instance, deriving a visible feature of the object instance by fusing the object region of interest feature and the bounding box feature, deriving an amodal feature of the object instance by fusing the object region of interest feature, the bounding box feature, and the visible feature, deriving an occlusion feature of the object instance by fusing the object region of interest feature, the bounding box feature, the visible feature, and the amodal feature, and inferring occlusion of an object instance by de-convoluting the occlusion feature of the object instance.
    Type: Application
    Filed: September 23, 2022
    Publication date: September 14, 2023
    Inventors: Seunghyeok BACK, Kyoobin LEE, Joosoon LEE, Taewon KIM, Raeyoung KANG, Sangjun NOH, Seongho BAK
  • Publication number: 20220084234
    Abstract: Provided are a method and electronic device for identifying a size of a measurement target object. The method includes imaging a reference object, which is a reference for identifying the size of the measurement target object, to acquire a reference object image, imaging the measurement target object to acquire a target object image, fusing the acquired reference object image and the acquired target object image, and inputting the fused reference object image and target object image to a first neural network model to acquire size information of the measurement target object from the first neural network model.
    Type: Application
    Filed: September 2, 2021
    Publication date: March 17, 2022
    Applicant: GIST(Gwangju Institute of Science and Technology)
    Inventors: Kyoobin LEE, Seunghyeok BACK, Sungho SHIN, Raeyoung KANG, Sangjun NOH