Patents by Inventor Seung Yob Kim

Seung Yob Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for recalculating analysis report of 3D scan data
    Patent number: 7365863
    Abstract: Disclosed is a system and method for allowing analysis results of scan data to have supplemental geometry and various measurements generated from the supplemental geometry or mutual common relations between geometric tolerances, and when the scan data changes, the analysis results according to the related data are recalculated in real time in order to simplify the repetitive inspection process according to the scan data changes.
    Type: Grant
    Filed: November 21, 2005
    Date of Patent: April 29, 2008
    Assignee: Inus Technology, Inc.
    Inventors: Seock Hoon Bae, Dong Hoon Lee, Seung Yob Kim, Sung Woo Cho
  • System and method for recalculating analysis report of 3D scan data
    Patent number: RE48998
    Abstract: Disclosed is a system and method for allowing analysis results of scan data to have supplemental geometry and various measurements generated from the supplemental geometry or mutual common relations between geometric tolerances, and when the scan data changes, the analysis results according to the related data are recalculated in real time in order to simplify the repetitive inspection process according to the scan data changes.
    Type: Grant
    Filed: June 7, 2019
    Date of Patent: March 29, 2022
    Assignee: 3D Systems, Inc.
    Inventors: Seock Hoon Bae, Dong Hoon Lee, Seung Yob Kim, Sung Wook Cho