Patents by Inventor Sevan Goenezen

Sevan Goenezen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180306691
    Abstract: Systems and methods disclosed herein enable the characterization of material property distribution across a sample to ensure sample consistency and/or to detect and characterize anomalies including tumors, inclusions, cracks, changes in structural stiffness in samples capable to experience deformation. The boundary displacement data is collected using a plurality of induced deformations at a plurality of angles and locations relative to surfaces/boundaries of the sample, and the data is transformed to determine material properties of the sample using numerical techniques and material modeling.
    Type: Application
    Filed: November 18, 2016
    Publication date: October 25, 2018
    Inventors: Sevan Goenezen, Yei Mei