Abstract: The test probe includes two arms, each having a front portion with a slot therethrough and a downwardly extending tip terminating in a probe end for contacting a test circuit. The first arm's tip is shorter than that of the second arm. A rear portion is affixable to a retaining block. A central portion includes an arm for connection with the circuit. The arms are commonly oriented with the second arm above and generally coplanar with the first arm in a first plane. The probe ends are generally coplanar in a second plane generally perpendicular to the first plane. Typically an assembly includes a first plurality of arms, affixed in stacked relation in a retaining block, and a second plurality of arms, affixed in stacked relation in the retaining block in opposite orientation to the first plurality, with multiple levels of arms extending parallel to the arm plane.

Abstract: A test probe for microcircuits includes a unitary elongated electrically conductive arm. A rear end portion is for connecting to a test circuit; a front end portion is for contacting a circuit to be tested and has an upwardly extending tip. A rear central portion is positioned adjacent the rear end portion, and a front central portion between the rear central portion and the front end portion, which has a slot extending between the side surfaces. Typically the test probe is sandwiched in spaced relation between two ground probes having rear portions for connecting to ground, which are movably affixed to a retaining block having slots for holding the probes. The configuration of the signal probe, the probe slot, and the ground probe is dependent upon the spacing between the probes, the retainer block material, the frequency of the signal, and the impedance.

Abstract: A multiple contact test probe assembly for testing miniature electronic circuit devices includes a non-conductive support having a plurality of spaced slots extending therethrough, all of the slots being substantially parallel and lying in a common plane. The assembly is provided with a plurality of electrically conductive contact elements, each element dimensioned to press fit within at least one of the slots and having a bend between the ends of each element to restrict sliding through the corresponding slot. At least one end of each contact element is adapted to sequentially engage a miniature electronic circuit for testing purposes, each contact element having sufficient tensile strength to withstand sequential testing of the circuit devices.