Abstract: A test probe for microcircuits includes a unitary elongated electrically conductive arm. A rear end portion is for connecting to a test circuit; a front end portion is for contacting a circuit to be tested and has an upwardly extending tip. A rear central portion is positioned adjacent the rear end portion, and a front central portion between the rear central portion and the front end portion, which has a slot extending between the side surfaces. Typically the test probe is sandwiched in spaced relation between two ground probes having rear portions for connecting to ground, which are movably affixed to a retaining block having slots for holding the probes. The configuration of the signal probe, the probe slot, and the ground probe is dependent upon the spacing between the probes, the retainer block material, the frequency of the signal, and the impedance.

Abstract: A test probe assembly for microelectronic circuits includes an electrically nonconductive support block, and at least one test probe of a flat metal stock, the test probe having an elongated body portion supported by the block and a probe tip with a flexed portion. The flexed portion has a flexing slot extending generally longitudinal with respect to the direction of the body portion, and defining two narrow, non-parallel flex means extending from the body portion to the probe tip. The flex beams and the flexing slot are dimensioned so that movement of the probe tip under stress toward the support block causes one of the beams to flex inwardly through the flexing slot and diminishes the distance between the two beams.

Abstract: A test probe for electronic circuit testing includes a probe arm joined to a printed circuit board adjacent to an electronic circuit to be tested, said probe arm having a flexible neck portion at one end. An electrically conductive tip is attached to the neck portion and has one end adapted to contact a portion of an electronic circuit. The neck portion of the probe arm is provided with a plurality of transverse slots and intermediate slots communicating between the transverse slots, the probe being provided with a flexible insert for extension across a preselected one of transverse slots in order to vary the probe tip pressure of the neck portion in directions substantially normal to the circuit under test.