Patents by Inventor Sha Chang

Sha Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240071656
    Abstract: A circuit protection device includes a first temperature sensitive resistor, a second temperature sensitive resistor, an electrically insulating multilayer, a first and second electrode layer, and at least one external electrode. The first temperature sensitive resistor and the second temperature sensitive resistor are electrically connected in parallel, and have a first upper electrically conductive layer and a second lower electrically conductive layer, respectively. The electrically insulating multilayer includes an upper insulating layer, a middle insulating layer, and a lower insulating layer. The upper insulating layer is between the first upper electrically conductive layer and the first electrode layer. The middle layer is laminated between the first temperature sensitive resistor and the second temperature sensitive resistor. The lower insulating layer is between the second lower electrically conductive layer and the second electrode layer.
    Type: Application
    Filed: January 13, 2023
    Publication date: February 29, 2024
    Inventors: Chien Hui WU, Yung-Hsien CHANG, Cheng-Yu TUNG, Ming-Hsun LU, Yi-An SHA
  • Publication number: 20220414808
    Abstract: Methods, systems, and media for determining and presenting information related to embedded sound recordings are provided.
    Type: Application
    Filed: December 11, 2019
    Publication date: December 29, 2022
    Inventors: Kevin Song Zhu, Thomas Bugnon, Keith Wedelich, George Huang, Jacob Levine, Sha Chang, Julian Bill, Arthur Gaudriot, Nicholas Bryan Johnson, Vishaal Prasad
  • Patent number: 10789149
    Abstract: Duplicate bug report detection using machine learning algorithms and automated feedback incorporation is disclosed. For each set of bug reports, a user-classification of the set of bug reports as including duplicate bug reports or non-duplicate bug reports is identified. Also for each set of bug reports, correlation values corresponding to a respective feature, of a plurality of features, between bug reports in the set of bug reports is identified. Based on the user-classifications and the correlation values, a model is generated to identify any set of bug reports as including duplicate bug reports or non-duplicate bug reports. The model is applied to classify a particular bug report and a candidate bug report as duplicate bug reports or non-duplicate bug reports.
    Type: Grant
    Filed: April 12, 2019
    Date of Patent: September 29, 2020
    Assignee: Oracle International Corporation
    Inventors: Prasad V. Bagal, Sameer Arun Joshi, Hanlin Daniel Chien, Ricardo Rey Diez, David Cavazos Woo, Emily Ronshien Su, Sha Chang
  • Patent number: 10379999
    Abstract: Duplicate bug report detection using machine learning algorithms and automated feedback incorporation is disclosed. For each set of bug reports, a user-classification of the set of bug reports as including duplicate bug reports or non-duplicate bug reports is identified. Also for each set of bug reports, correlation values corresponding to a respective feature, of a plurality of features, between bug reports in the set of bug reports is identified. Based on the user-classifications and the correlation values, a model is generated to identify any set of bug reports as including duplicate bug reports or non-duplicate bug reports. The model is applied to classify a particular bug report and a candidate bug report as duplicate bug reports or non-duplicate bug reports.
    Type: Grant
    Filed: January 11, 2016
    Date of Patent: August 13, 2019
    Assignee: Oracle International Corporation
    Inventors: Prasad V. Bagal, Sameer Arun Joshi, Hanlin Daniel Chien, Ricardo Rey Diez, David Cavazos Woo, Emily Ronshien Su, Sha Chang
  • Publication number: 20190235987
    Abstract: Duplicate bug report detection using machine learning algorithms and automated feedback incorporation is disclosed. For each set of bug reports, a user-classification of the set of bug reports as including duplicate bug reports or non-duplicate bug reports is identified. Also for each set of bug reports, correlation values corresponding to a respective feature, of a plurality of features, between bug reports in the set of bug reports is identified. Based on the user-classifications and the correlation values, a model is generated to identify any set of bug reports as including duplicate bug reports or non-duplicate bug reports. The model is applied to classify a particular bug report and a candidate bug report as duplicate bug reports or non-duplicate bug reports.
    Type: Application
    Filed: April 12, 2019
    Publication date: August 1, 2019
    Applicant: Oracle International Corporation
    Inventors: Prasad V. Bagal, Sameer Arun Joshi, Hanlin Daniel Chien, Ricardo Rey Diez, David Cavazos Woo, Emily Ronshien Su, Sha Chang
  • Patent number: 10339030
    Abstract: Duplicate bug report detection using machine learning algorithms and automated feedback incorporation is disclosed. For each set of bug reports, a user-classification of the set of bug reports as including duplicate bug reports or non-duplicate bug reports is identified. Also for each set of bug reports, correlation values corresponding to a respective feature, of a plurality of features, between bug reports in the set of bug reports is identified. Based on the user-classifications and the correlation values, a model is generated to identify any set of bug reports as including duplicate bug reports or non-duplicate bug reports. The model is applied to classify a particular bug report and a candidate bug report as duplicate bug reports or non-duplicate bug reports.
    Type: Grant
    Filed: January 11, 2016
    Date of Patent: July 2, 2019
    Assignee: Oracle International Corporation
    Inventors: Prasad V. Bagal, Sameer Arun Joshi, Hanlin Daniel Chien, Ricardo Rey Diez, David Cavazos Woo, Emily Ronshien Su, Sha Chang
  • Publication number: 20170199803
    Abstract: Duplicate bug report detection using machine learning algorithms and automated feedback incorporation is disclosed. For each set of bug reports, a user-classification of the set of bug reports as including duplicate bug reports or non-duplicate bug reports is identified. Also for each set of bug reports, correlation values corresponding to a respective feature, of a plurality of features, between bug reports in the set of bug reports is identified. Based on the user-classifications and the correlation values, a model is generated to identify any set of bug reports as including duplicate bug reports or non-duplicate bug reports. The model is applied to classify a particular bug report and a candidate bug report as duplicate bug reports or non-duplicate bug reports.
    Type: Application
    Filed: January 11, 2016
    Publication date: July 13, 2017
    Inventors: Prasad V. Bagal, Sameer Arun Joshi, Hanlin Daniel Chien, Ricardo Rey Diez, David Cavazos Woo, Emily Ronshien Su, Sha Chang
  • Publication number: 20070114434
    Abstract: Multi-pixel electron microbeam irradiator systems and methods are provided with particular applicability for selectively irradiating predetermined cells or cell locations. A multi-pixel electron microbeam irradiator system can include a plurality of individually addressable electron field emitters sealed in a vacuum. The multi-pixel electron microbeam irradiator system can include an anode comprising one or more electron permeable portions corresponding to the plurality of electron field emitters. Further, the multi-pixel electron microbeam irradiator system can include a controller operable to individually control electron extraction from each of the electron field emitters for selectively irradiating predetermined locations such as cells or cell locations.
    Type: Application
    Filed: December 28, 2005
    Publication date: May 24, 2007
    Inventors: Sha Chang, Otto Zhou
  • Patent number: 6853705
    Abstract: In a method for sequentially generating segment fields for use in delivering intensity modulated radiotherapy an input continuous intensity map is generated. A segment field is generated directly from the input intensity map. A residual continuous intensity map is generated that is based on the respective photon fluence contributions from the input intensity map and a fractionally intensity map corresponding to the segment field. These steps are repeated for a number of iterations to generate a like number of additional segment fields and residual maps derived therefrom. In each iteration, the residual map generated in the previous iteration is used as the input intensity map.
    Type: Grant
    Filed: March 28, 2003
    Date of Patent: February 8, 2005
    Assignee: The University of North Carolina at Chapel Hill
    Inventor: Sha Chang
  • Publication number: 20040190680
    Abstract: In a method for sequentially generating segment fields for use in delivering intensity modulated radiotherapy an input continuous intensity map is generated. A segment field is generated directly from the input intensity map. A residual continuous intensity map is generated that is based on the respective photon fluence contributions from the input intensity map and a fractionally intensity map corresponding to the segment field. These steps are repeated for a number of iterations to generate a like number of additional segment fields and residual maps derived therefrom. In each iteration, the residual map generated in the previous iteration is used as the input intensity map.
    Type: Application
    Filed: March 28, 2003
    Publication date: September 30, 2004
    Applicant: The University of North Carolina at Chapel Hill
    Inventor: Sha Chang