Abstract: A system and method for providing compliant mapping between chip bond locations of an IC and corresponding package bond locations is disclosed. Package design information including package bond location information relating to the IC package and IC mask data including chip bond location information relating to the IC chip are integrated such that an internal physical design verification tool is operable to verify compliance between package bond locations and chip bond locations.

Abstract: For a given channel and a filter having at least one filter tap, a set of at least one weight value is determined for the at least one filter tap according to which at least one weight value substantially minimizes a gradient of a frequency response for the given channel and substantially maximizes energy of the frequency response for the given channel within a predetermined bandwidth.

Abstract: An embodiment of this invention provides a circuit and method for reducing the number of electronic components needed to calibrate circuits on an IC. A multiplexer is located on the IC where the outputs of a plurality of circuits located on the IC are each connected to a separate data input of the multiplexer. The control input of the multiplexer selects which data input of the multiplexer is connected to an external component. Each data input is individually connected to the component periodically.

Abstract: A preferred integrated circuit for facilitating receiver trip level testing functionality includes a first pad which incorporates a first driver and a first receiver. The first driver is configured to provide a first pad output signal to a component external to the IC. The first receiver is configured to receive a first pad input signal from a component external to the IC, and to provide a first receiver digital output signal to a component internal to the IC in response to the first pad input signal. Additionally, a first test circuit is provided that is arranged internal to the IC, with the first test circuit being adapted to provide information corresponding to at least one receiver trip-level characteristic of the first receiver of the first pad. Systems, methods and computer readable media also are provided.

Abstract: A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit.

Abstract: A system and method for providing compliant mapping between chip bond locations of an IC and corresponding package bond locations is disclosed. Package design information including package bond location information relating to the IC package and IC mask data including chip bond location information relating to the IC chip are integrated such that an internal physical design verification tool is operable to verify compliance between package bond locations and chip bond locations.

Abstract: A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit. Integrated circuits, methods and computer readable media also are provided.

Abstract: A preferred integrated circuit for facilitating receiver trip level testing functionality includes a first pad which incorporates a first driver and a first receiver. The first driver is configured to provide a first pad output signal to a component external to the IC. The first receiver is configured to receive a first pad input signal from a component external to the IC, and to provide a first receiver digital output signal to a component internal to the IC in response to the first pad input signal. Additionally, a first test circuit is provided that is arranged internal to the IC, with the first test circuit being adapted to provide information corresponding to at least one receiver trip-level characteristic of the first receiver of the first pad. Systems, methods and computer readable media also are provided.

Abstract: A preferred integrated circuit for facilitating receiver trip level testing functionality includes a first pad which incorporates a first driver and a first receiver. The first driver is configured to provide a first pad output signal to a component external to the IC. The first receiver is configured to receive a first pad input signal from a component external to the IC, and to provide a first receiver digital output signal to a component internal to the IC in response to the first pad input signal. Additionally, a first test circuit is provided that is arranged internal to the IC, with the first test circuit being adapted to provide information corresponding to at least one receiver trip-level characteristic of the first receiver of the first pad. Systems, methods and computer readable media also are provided.

Abstract: Digital data transmission using three logic states on a differential pair of signal lines. The three states are: a first line a threshold higher than a second line, the second line a threshold higher than the first line, and when both lines are approximately equal. The presence of three states allows the receiving circuit to recognize the beginning and end of a valid data bit. A receiving circuit using two comparators to generate strobes for latching the data is also disclosed. The strobes also clock a counter whose output is fed to a decoder. The output of the decoder is used to select one of N latches that are used to latch the incoming data.

Abstract: A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit.

Abstract: A voltage ramp/threshold variable pulse delay circuit implemented on an IC varies the R instead of the C, which may be fixed. A variable R is formed by a plurality of FET's arranged in parallel. The FET's are sized according to a weighting scheme, which may be binary, and the amount of R produced is determined by which combination of FET's is switched ON, rather than by analog variations in their drive level. If the plurality of sized parallel FET's is made up of individual FET's all of the same polarity, then an undesirable reduction in voltage comparison range will obtain, which may produce an objectionable reduction in available pulse delay if VDD is reduced such that it is no longer many times larger than FET threshold voltage. That reduction in voltage comparison range can be eliminated by replacing each such individual FET with a pair of similarly sized FET's in parallel, the members of which pair are of opposite polarities.

Abstract: A gate transition counter. A ring oscillator provides a plurality outputs, each delayed from the adjacent output by a gate delay. The outputs of the ring oscillator are captured by an array of latches upon receipt of a halt signal. The last latch drives a ripple counter. The preferred implementation uses five inverters in the ring oscillator so that each complete cycle of the ring oscillator represents ten gate delays. A ripple counter counts the number of gate delays by ten. The latch outputs and the ripple counter outputs can be converted to a binary representation of the number of gate delays to provide a count with the smallest time increment that can be produced by the circuit.

Abstract: Digital data transmission using three logic states on a differential pair of signal lines. The three states are: a first line a threshold higher than a second line, the second line a threshold higher than the first line, and when both lines are approximately equal. The presence of three states allows the receiving circuit to recognize the beginning and end of a valid data bit. A receiving circuit using two comparators to generate strobes for latching the data is also disclosed. The strobes also clock a counter whose output is fed to a decoder. The output of the decoder is used to select one of N latches that are used to latch the incoming data.

Abstract: A process, voltage, and temperature calibration system that shares a single calibration resistor among multiple calibration circuits. The use of single calibration resistor among several calibration circuits is accomplished through time division multiplexing. N-channel and P-channel field effect transistor calibration also share the same resistor. Turning on transistors in calibration circuits of the type not being calibrated creates a low impedance path from one terminal of the calibration resistor to a power supply. This biases the calibration resistor for the calibration circuit.

Abstract: Two complementary clocks that are well matched are produced from a single input clock. A clock buffer includes an alternating series of edge-rate-controlled inverters and level restoring inverters. The output of this series of inverters is compared to the input clock by a race timer. If the output of the series of inverters switches in the opposite direction before the input clock, the edge rates of the series of inverters are slowed down. If the output of the series of inverters switches in the opposite direction after the input clock, the edge rates of the series of inverters are speeded up. The output of the series of inverters eventually approaches the timing of the input clock but complemented. These signals form a pair of complementary clocks with well matched timing.

Abstract: The inventive mechanism prevents current flow from the drain to the source and substrate, in a power off condition of a p-type FET. The current flow from the drain to the substrate is prevented by raising the voltage required to turn on the diodes that are formed when the power is off. This is accomplished by having the substrate gate connected to a series of diodes formed from other pFET devices. The combined threshold voltage of the series exceeds a voltage associated with the current. The current flow from the drain to the source is prevented by pinching off the channel of the pFET during a power off condition. Since a high signal is required to turn off a pFET device and the power to the pFET is off, an off chip voltage associated with the current is used to turn off the pFET. A current sink FET is used to prevent reflections by supplying the proper impedance to receive the off chip signal associated with the current.