Abstract: Methods and apparatuses are described herein for metastability error detection and correction in analog-to-digital converters (ADCs). For example, an ADC may comprise a comparator, a register circuit, a first circuit, and a second circuit. The comparator may generate a comparator output signal in response to a sampling clock signal. The register circuit, operatively coupled to the comparator, may process the comparator output signal. The first circuit, operatively coupled to the comparator and the register circuit may generate a plurality of first output bits that include a bit indicating a metastability error on a condition that the metastability error occurred during the bit conversion. The second circuit, operatively coupled to the first circuit, may generate a plurality of second output bits indicating a location of the metastability error. The plurality of second output bits may be sampled using first and second groups in response to the sampling clock signal.

Abstract: A method and apparatus are disclosed for asynchronous clock generation in analog-to-digital converters (ADCs). For example, an ADC may comprise a comparator, a first logic gate, a second logic gate, a first memory element, a second memory element, and a digital-to-analog converter (DAC). The comparator may initiate an evaluation or precharge operation of comparator inputs. The first logic gate may generate, based on comparator outputs, a first output signal indicating validity of first logic gate output. The second logic gate may generate a second output signal indicating timing reference of bit conversion. The first memory element may generate a third output signal indicating a current state of a bit. The second memory element may generate a plurality of next state bits based on the second output signal and the comparator outputs. The second logic gate may generate the second output signal based on the first and third output signals.

Abstract: Methods and apparatuses are described herein for metastability error detection and correction in analog-to-digital converters (ADCs). For example, an ADC may comprise a comparator, a register circuit, a first circuit, and a second circuit. The comparator may generate a comparator output signal in response to a sampling clock signal. The register circuit, operatively coupled to the comparator, may process the comparator output signal. The first circuit, operatively coupled to the comparator and the register circuit may generate a plurality of first output bits that include a bit indicating a metastability error on a condition that the metastability error occurred during the bit conversion. The second circuit, operatively coupled to the first circuit, may generate a plurality of second output bits indicating a location of the metastability error. The plurality of second output bits may be sampled using first and second groups in response to the sampling clock signal.