Patents by Inventor Shahar ARAD

Shahar ARAD has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11815470
    Abstract: Disclosed herein is a method for detecting defects on a sample. The method includes obtaining scan data of a region of a sample in a multiplicity of perspectives, and performing an integrated analysis of the obtained scan data. The integrated analysis includes computing, based on the obtained scan data, and/or estimating cross-perspective covariances, and determining presence of defects in the region, taking into account the cross-perspective covariances.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: November 14, 2023
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Haim Feldman, Eyal Neistein, Harel Ilan, Shahar Arad, Ido Almog, Ori Golani
  • Patent number: 10957034
    Abstract: There are provided a system and method of examination on a specimen, the method comprising: obtaining an inspection image of a die and generating a defect map using one or more reference images; selecting a plurality of defect candidates from the defect map; and generating for each defect candidate, a respective modified inspection image patch, comprising: extracting an image patch surrounding the defect candidate respectively from the inspection image and each reference image; and modifying the inspection image patch, comprising: estimating noise representative of intensity variations on the inspection image patch, the noise including a first type of noise representative of a polynomial relation between the inspection and reference image patches, and a second type of noise representative of a spatial anomaly in the inspection image patch, and removing at least one of the first and second types of noise from the inspection image patch based on the estimated noise.
    Type: Grant
    Filed: January 17, 2019
    Date of Patent: March 23, 2021
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Elad Cohen, Shahar Arad
  • Patent number: 10902582
    Abstract: A method, system and computer readable medium for providing information about a region of a sample. The method includes (i) obtaining, by an imager, multiple images of the region; wherein the multiple images differ from each other by at least one parameter (ii) receiving or generating multiple reference images; (iii) generating multiple difference images that represent differences between the multiple images and the multiple reference images; (iv) calculating a set of region pixel attributes, (v) calculating a set of noise attributes, based on multiple sets of region pixels attributes of the multiple region pixels; and (vi) determining for each region pixel, whether the region pixel represents a defect based on a relationship between the set of noise attributes and the set of region pixel attributes of the pixel.
    Type: Grant
    Filed: January 17, 2019
    Date of Patent: January 26, 2021
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Haim Feldman, Eyal Neistein, Harel Ilan, Shahar Arad, Ido Almog
  • Publication number: 20200400589
    Abstract: Disclosed herein is a method for detecting defects on a sample. The method includes obtaining scan data of a region of a sample in a multiplicity of perspectives, and performing an integrated analysis of the obtained scan data. The integrated analysis includes computing, based on the obtained scan data, and/or estimating cross-perspective covariances, and determining presence of defects in the region, taking into account the cross-perspective covariances.
    Type: Application
    Filed: September 2, 2020
    Publication date: December 24, 2020
    Inventors: Haim FELDMAN, Eyal NEISTEIN, Harel ILAN, Shahar ARAD, Ido ALMOG
  • Publication number: 20200234417
    Abstract: There are provided a system and method of examination on a specimen, the method comprising: obtaining an inspection image of a die and generating a defect map using one or more reference images; selecting a plurality of defect candidates from the defect map; and generating for each defect candidate, a respective modified inspection image patch, comprising: extracting an image patch surrounding the defect candidate respectively from the inspection image and each reference image; and modifying the inspection image patch, comprising: estimating noise representative of intensity variations on the inspection image patch, the noise including a first type of noise representative of a polynomial relation between the inspection and reference image patches, and a second type of noise representative of a spatial anomaly in the inspection image patch, and removing at least one of the first and second types of noise from the inspection image patch based on the estimated noise.
    Type: Application
    Filed: January 17, 2019
    Publication date: July 23, 2020
    Inventors: Elad COHEN, Shahar ARAD
  • Publication number: 20200232934
    Abstract: Disclosed herein is a method for detecting defects on a sample. The method includes obtaining scan data of a region of a sample in a multiplicity of perspectives, and performing an integrated analysis of the obtained scan data. The integrated analysis includes computing, based on the obtained scan data, and/or estimating cross-perspective covariances, and determining presence of defects in the region, taking into account the cross-perspective covariances.
    Type: Application
    Filed: January 17, 2020
    Publication date: July 23, 2020
    Inventors: Haim FELDMAN, Eyal NEISTEIN, Harel ILAN, Shahar ARAD, Ido ALMOG
  • Publication number: 20200234418
    Abstract: A method, system and computer readable medium for providing information about a region of a sample. The method includes (i) obtaining, by an imager, multiple images of the region; wherein the multiple images differ from each other by at least one parameter (ii) receiving or generating multiple reference images; (iii) generating multiple difference images that represent differences between the multiple images and the multiple reference images; (iv) calculating a set of region pixel attributes, (v) calculating a set of noise attributes, based on multiple sets of region pixels attributes of the multiple region pixels; and (vi) determining for each region pixel, whether the region pixel represents a defect based on a relationship between the set of noise attributes and the set of region pixel attributes of the pixel.
    Type: Application
    Filed: January 17, 2019
    Publication date: July 23, 2020
    Inventors: Haim FELDMAN, Eyal NEISTEIN, Harel ILAN, Shahar ARAD, Ido ALMOG