Abstract: A high availability controller for combining and unifying aspects of a process controller and an electrical controller. A unified namespace combines a process domain namespace and a power domain namespace in a common database of the controller without altering either. The unified namespace maps source device names of the power domain and unique process control names of the process domain. A common record set of sequence of events (SOEs) for the process domain and the power domain is generated and SOEs arising from the power domain are incorporated into the common record set. The controller performs process control and monitoring along with electrical control signaling and monitoring within a single control strategy directly from the controller.

Abstract: A high availability controller for combining and unifying aspects of a process controller and an electrical controller. A unified namespace combines a process domain namespace and a power domain namespace in a common database of the controller without altering either. The unified namespace maps source device names of the power domain and unique process control names of the process domain. A common record set of sequence of events (SOEs) for the process domain and the power domain is generated and SOEs arising from the power domain are incorporated into the common record set. The controller performs process control and monitoring along with electrical control signaling and monitoring within a single control strategy directly from the controller.

Abstract: A high-speed scalable backplane enables communications between a central processing unit (CPU) module and field input/output (I/O) and/or communication modules. The backplane comprises a root hub associated with the CPU module. The backplane also includes a plurality of Universal Serial Bus (USB) hubs sequentially coupled to each other and arranged according to the tiered architecture. Each of the USB hubs has an upstream port and a plurality of downstream ports. A top USB hub has an upstream port coupled to a host port of the root hub. One or more lower USB hubs each have an upstream port coupled to a selected downstream port of one of the USB hubs in an immediately preceding tier of the tiered architecture. The lower USB hubs are each configured to enable a plurality of I/O and/or communications connections for the modules via a plurality of downstream ports.

Abstract: A synchronization manager interface determines a first state of execution of an application task executing on a first controller at defined synchronization points and further determines a second state of execution of the application task executing on a second controller at the defined synchronization points. The synchronization manager interface, when executed, configures the first controller to transmit the first state from the first controller to the second controller via a communications channel established between the controllers for verifying a successful synchronization of the application task on the controllers based on a comparison of the first state with the second state.

Abstract: Systems and methods for measuring rotational frequency in rotating machines use variable sliding windows of measurement. The systems and methods count and store the number of internal clock cycles between the start of a measurement interval and each pulse signal from a pulse generator. Rotational frequency is determined by taking a difference between the count for a most recent pulse signal and the count for some previous pulse signal within the measurement interval. The number of pulse signals that have occurred between the most-recent pulse signal and the previous pulse signal represents a window of measurement. This window of measurement, or the size thereof, may then be used along with the count difference to determine the rotational frequency. The window of measurement may then be slid to the counts for next most recent pulse signal and the next previous pulse signal to obtain a new count difference, and so on.

Abstract: Systems and methods for measuring rotational frequency in rotating machines use variable sliding windows of measurement. The systems and methods count and store the number of internal clock cycles between the start of a measurement interval and each pulse signal from a pulse generator. Rotational frequency is determined by taking a difference between the count for a most recent pulse signal and the count for some previous pulse signal within the measurement interval. The number of pulse signals that have occurred between the most-recent pulse signal and the previous pulse signal represents a window of measurement. This window of measurement, or the size thereof, may then be used along with the count difference to determine the rotational frequency. The window of measurement may then be slid to the counts for next most recent pulse signal and the next previous pulse signal to obtain a new count difference, and so on.

Abstract: Disclosed are a molded article picker for a post-mold device and a related method for the use of the molded article picker for handling a molded article. The molded article picker includes a structure having a surface defining an interior that is configured to surround an end portion of the molded article. A sealing surface disposed on the structure is configured to sealingly cooperate with a surface of an outwardly projecting portion of the molded article in response to an evacuation of the interior, wherein the seal allows for the molded article to be retained with the structure.

Abstract: A molding system having a melt pathway configured to convey a molding material. The molding system includes a viscous-drag sensor having: (i) a pathway blockage, and (ii) an actuator. The viscous-drag sensor is interactable with the molding material. The pathway blockage is movable along the melt pathway. The pathway blockage is movable along a first direction to further open the melt pathway. The pathway blockage is movable along a second direction to further close the melt pathway. The actuator is coupled with the pathway blockage. The actuator biases the pathway blockage to vary the melt pathway while the molding material drags along and moves the pathway blockage. Responsive to the pathway blockage sensing viscous-drag force, the pathway blocks acts to: (i) further open the melt pathway if a viscosity of the molding material is high, and (ii) further close the melt pathway if the viscosity of the molding material is low.

Abstract: A cooling tube assembly for operating on a malleable molded plastic part. The cooling tube assembly comprising a porous tube/insert having a profiled inner conditioning surface, and a vacuum structure configured to cooperate with the porous tube. In use, the vacuum develops a reduced pressure adjacent the inner conditioning surface to cause an outer surface of the malleable molded plastic part, locatable within the cooling tube assembly, to contact the inner conditioning surface of the porous insert so as to allow a substantial portion of the outer surface of the malleable part, upon cooling, to attain a profile substantially corresponding to the profile of the inner conditioning surface. The cooling tube assembly further including a suction channel therein that is configured to cooperate with a valve member for the control of a suction flow therethrough that assists in a transferring of the molded article into the cooling tube assembly.

Abstract: Disclosed are a molded article picker for a post-mold device and a related method for the use of the molded article picker for handling a molded article. The molded article picker includes a structure having a surface defining an interior that is configured to surround an end portion of the molded article. A sealing surface disposed on the structure is configured to sealingly cooperate with a surface of an outwardly projecting portion of the molded article in response to an evacuation of the interior, wherein the seal allows for the molded article to be retained with the structure.

Abstract: A cooling tube assembly for operating on a malleable molded plastic part. The cooling tube assembly comprising a porous tube/insert having a profiled inner conditioning surface, and a vacuum structure configured to cooperate with the porous tube. In use, the vacuum develops a reduced pressure adjacent the inner conditioning surface to cause an outer surface of the malleable molded plastic part, locatable within the cooling tube assembly, to contact the inner conditioning surface of the porous insert so as to allow a substantial portion of the outer surface of the malleable part, upon cooling, to attain a profile substantially corresponding to the profile of the inner conditioning surface.

Abstract: Disclosed is (i) a molding system, including a viscous-drag sensor interactable with a molding material flowable along a melt pathway and/or (ii) a method of a molding-system, amongst other things.

Abstract: A cooling tube assembly for operating on a malleable molded plastic part. The cooling tube assembly comprising a porous tube/insert having a profiled inner conditioning surface, and a vacuum structure configured to cooperate with the porous tube. In use, the vacuum develops a reduced pressure adjacent the inner conditioning surface to cause an outer surface of the malleable molded plastic part, locatable within the cooling tube assembly, to contact the inner conditioning surface of the porous insert so as to allow a substantial portion of the outer surface of the malleable part, upon cooling, to attain a profile substantially corresponding to the profile of the inner conditioning surface. The cooling tube assembly having a simplified cooling structure that includes a cooling channel configured on the porous insert, the surface of which include a surface treatment for a sealing thereof to substantially avoid a leakage of coolant therethrough.

Abstract: A cooling tube assembly for operating on a malleable molded plastic part. The cooling tube assembly comprising a porous tube/insert having a profiled inner conditioning surface, and a vacuum structure configured to cooperate with the porous tube. In use, the vacuum develops a reduced pressure adjacent the inner conditioning surface to cause an outer surface of the malleable molded plastic part, locatable within the cooling tube assembly, to contact the inner conditioning surface of the porous insert so as to allow a substantial portion of the outer surface of the malleable part, upon cooling, to attain a profile substantially corresponding to the profile of the inner conditioning surface. The cooling tube assembly further including a suction channel therein that is configured to cooperate with a valve member for the control of a suction flow therethrough that assists in a transferring of the molded article into the cooling tube assembly.

Abstract: A cooling tube assembly for operating on a malleable molded plastic part. The cooling tube assembly comprising a porous tube/insert having a profiled inner conditioning surface, and a vacuum structure configured to cooperate with the porous tube. In use, the vacuum develops a reduced pressure adjacent the inner conditioning surface to cause an outer surface of the malleable molded plastic part, locatable within the cooling tube assembly, to contact the inner conditioning surface of the porous insert so as to allow a substantial portion of the outer surface of the malleable part, upon cooling, to attain a profile substantially corresponding to the profile of the inner conditioning surface. The cooling tube assembly further including a suction channel therein that is configured to cooperate with a valve member for the control of a suction flow therethrough that assists in a transferring of the molded article into the cooling tube assembly.

Abstract: A method and system providing for electrical testing of an integrated semiconductor substrate having at least two signal processing layers. The substrate may be provided with a protective layer of plastic, silicon, silicon oxide, silicon nitride or the like. A selected region of one substrate layer to be tested electrically is exposed by etching or otherwise forming a controllably small aperture any overlying substrate layer(s) away to expos at least one selected circuit trace in the selected region and applying a selected electrical signal to the trace. Optionally, a second aperture, spaced apart from the first aperture, can be formed to expose a second selected circuit trace so that propagation of a signal in one or more substrate circuits can be tested. The aperture cross-sectional shapes may be linear or curvilinear polygons or other suitable shapes.

Abstract: A method for providing for electrical testing of an integrated semiconductor substrate having at least two signal processing layers. The substrate may be provided with a protective layer of plastic, silicon, silicon oxide, silicon nitride or the like. A selected region of one substrate layer to be tested electrically is exposed by etching or otherwise forming a controllably small aperture any overlying substrate layer(s) away to expose at least one selected circuit trace in the selected region and applying a selected electrical signal to the trace. Optionally, a second aperture, spaced apart from the first aperture, can be formed to expose a second selected circuit trace so that propagation of a signal in one or more substrate circuits can be tested. The aperture cross-sectional shapes may be linear or curvilinear polygons or other suitable shapes.