Abstract: Techniques are disclosed for testing transceiver devices. A test controller is operatively coupled to a plurality of transceiver ports, coupled with waveguide interfaces. The test controller transmits a test signal via the interface from a first selected transceiver port, determines a characteristic of the test signal received at a second selected transceiver port, and determines whether the first or second selected transceiver port is coupled to an expected transceiver based on the characteristic of the test signal. Secondary or multiway interfaces may be used for other transceiver ports to transmit a second test signal to determine, based on the characteristics of the second test signal, whether the other transceiver ports are properly configured as source and destination ports.