Abstract: A system and method are presented, for monitoring and/or imaging of a sample. The system comprises: a light unit configured for illuminating the sample in at least two different wavelength ranges; a collection unit configured for collecting a light emitted from the sample in at least a third wavelength range and directing said emitted light towards at least one detector; and an activation unit configured for providing activation signal to selectively activate at least a portion of fluorescent substance in the sample; and a processing circuitry configured for operating the light unit to determine a selected temporal illumination profile of said at least two different wavelength ranges and for operating the activation unit for controllable activation.

Abstract: Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.

Abstract: Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.

Abstract: A system and method are presented, for monitoring and/or imaging of a sample. The system comprises: a light unit configured for illuminating the sample in at least two different wavelength ranges; a collection unit configured for collecting a light emitted from the sample in at least a third wavelength range and directing said emitted light towards at least one detector; and an activation unit configured for providing activation signal to selectively activate at least a portion of fluorescent substance in the sample; and a processing circuitry configured for operating the light unit to determine a selected temporal illumination profile of said at least two different wavelength ranges and for operating the activation unit for controllable activation.