Patents by Inventor Shaik Shafi Ahamed

Shaik Shafi Ahamed has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8788138
    Abstract: A method is provided for diagnosing an aircraft. The method includes: determining a location of a fault in the aircraft; determining a zone of the aircraft that is associated with the location of the fault; and generating an interactive three-dimensional user interface based on the zone, wherein the interactive three-dimensional user interface provides fault data of at least one of historical faults and current faults associated with the zone.
    Type: Grant
    Filed: February 26, 2013
    Date of Patent: July 22, 2014
    Assignee: Honeywell International Inc.
    Inventors: Aralakuppe Ramegowda Yogesha, Sundeep Vanka, Shaik Shafi Ahamed, Srinivasa Rao Dangeti, Zhenning Liu
  • Patent number: 8324906
    Abstract: Hidden or overlapped peaks may occur when using SSTDR technology to determine ware faults. These hidden/overlapped peaks may cause false negative determinations (no fault) when testing a wire for faults. In one method of the present invention, the symmetrical property of the SSTDR wave envelope is used to resolve hidden/overlapped peaks. In another method of the present invention, the calibrated normalized loop back SSTDR wave envelope may be used to resolve hidden/overlapped peaks.
    Type: Grant
    Filed: March 19, 2010
    Date of Patent: December 4, 2012
    Assignee: Honeywell International Inc.
    Inventors: Shaik Shafi Ahamed, Srinivasa Rao Dangeti, Narasimha Rao Pesala, Thappeta Peddaiah, Sreenivasulu Reddy Vedicherla, Vedagiribabu Subramanyam, Zhenning Liu
  • Publication number: 20110227582
    Abstract: Hidden or overlapped peaks may occur when using SSTDR technology to determine ware faults. These hidden/overlapped peaks may cause false negative determinations (no fault) when testing a wire for faults. In one method of the present invention, the symmetrical property of the SSTDR wave envelope is used to resolve hidden/overlapped peaks. In another method of the present invention, the calibrated normalized loop back SSTDR wave envelope may be used to resolve hidden/overlapped peaks.
    Type: Application
    Filed: March 19, 2010
    Publication date: September 22, 2011
    Applicant: HONEYWELL INTERNATIONAL INC.
    Inventors: SHAIK SHAFI AHAMED, SRINIVASA RAO DANGETI, NARASIMHA RAO PESALA, THAPPETA PEDDAIAH, SREENIVASULU REDDY VEDICHERLA, VEDAGIRIBABU SUBRAMANYAM, ZHENNING LIU