Patents by Inventor Shail Srinivas

Shail Srinivas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10063188
    Abstract: A technique for reducing jitter in an oscillating signal generated by an oscillator circuit includes reducing feedback of gate leakage current while increasing electrostatic discharge protection and reducing regulated power supply requirements of the oscillator circuit, as compared to conventional oscillator circuits. A circuit includes a first integrated circuit terminal and a thick gate native transistor of a first conductivity type having a first gate terminal having a first gate thickness. The first gate terminal is coupled to the first integrated circuit terminal. The thick gate native transistor has a first threshold voltage. The thick gate native transistor is configured as a source follower. The circuit includes a second transistor of the first conductivity type having a second gate terminal with a second gate thickness less than the first gate thickness. The second gate terminal is coupled to a source terminal of the thick gate native transistor.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: August 28, 2018
    Assignee: Silicon Laboratories Inc.
    Inventor: Shail Srinivas
  • Publication number: 20170317645
    Abstract: A technique for reducing jitter in an oscillating signal generated by an oscillator circuit includes reducing feedback of gate leakage current while increasing electrostatic discharge protection and reducing regulated power supply requirements of the oscillator circuit, as compared to conventional oscillator circuits. A circuit includes a first integrated circuit terminal and a thick gate native transistor of a first conductivity type having a first gate terminal having a first gate thickness. The first gate terminal is coupled to the first integrated circuit terminal. The thick gate native transistor has a first threshold voltage. The thick gate native transistor is configured as a source follower. The circuit includes a second transistor of the first conductivity type having a second gate terminal with a second gate thickness less than the first gate thickness. The second gate terminal is coupled to a source terminal of the thick gate native transistor.
    Type: Application
    Filed: April 28, 2016
    Publication date: November 2, 2017
    Inventor: Shail Srinivas
  • Patent number: 6950342
    Abstract: A number of designs for differential floating gate nonvolatile memories and memory arrays utilize differential pFET floating gate transistors to store information. Methods of implementing such memories and memory arrays together with methods of operation and test associated with such memories and memory arrays are presented.
    Type: Grant
    Filed: May 12, 2003
    Date of Patent: September 27, 2005
    Assignee: Impinj, Inc.
    Inventors: Chad A. Lindhorst, Christopher J. Diorio, Troy N. Gilliland, Alberto Pesavento, Shail Srinivas, Yanjun Ma, Terry Hass, Kambiz Rahimi
  • Patent number: 6853583
    Abstract: Methods and apparatuses prevent overtunneling in pFET-based nonvolatile floating gate memory (NVM) cells. During a tunneling process, in which charge carriers are removed from a floating gate of a pFET-based NVM cell, a channel current of a memory cell transistor is monitored and compared to a predetermined minimum channel current required to maintain a conducting channel in an injection transistor of the memory cell. When the monitored channel current drops below the predetermined minimum channel current, charge carriers are injected onto the floating gate by impact-ionized hot-electron injection (IHEI) so that overtunneling is avoided.
    Type: Grant
    Filed: September 16, 2002
    Date of Patent: February 8, 2005
    Assignee: Impinj, Inc.
    Inventors: Christopher J. Diorio, Chad Lindhorst, Shail Srinivas, Alberto Pesavento, Troy Gilliland
  • Publication number: 20040052113
    Abstract: Methods and apparatuses prevent overtunneling in pFET-based nonvolatile floating gate memory (NVM) cells. During a tunneling process, in which charge carriers are removed from a floating gate of a pFET-based NVM cell, a channel current of a memory cell transistor is monitored and compared to a predetermined minimum channel current required to maintain a conducting channel in an injection transistor of the memory cell. When the monitored channel current drops below the predetermined minimum channel current, charge carriers are injected onto the floating gate by impact-ionized hot-electron injection (IHEI) so that overtunneling is avoided.
    Type: Application
    Filed: September 16, 2002
    Publication date: March 18, 2004
    Applicant: Impinj, Inc., a Delaware Corporation
    Inventors: Christopher J. Diorio, Chad Lindhorst, Shail Srinivas, Alberto Pesavento, Troy Gilliland
  • Publication number: 20040037127
    Abstract: A number of designs for differential floating gate nonvolatile memories and memory arrays utilize differential pFET floating gate transistors to store information. Methods of implementing such memories and memory arrays together with methods of operation and test associated with such memories and memory arrays are presented.
    Type: Application
    Filed: May 12, 2003
    Publication date: February 26, 2004
    Applicant: Impinj, Inc., A Delaware Corporation
    Inventors: Chad A. Lindhorst, Christopher J. Diorio, Troy N. Gilliland, Alberto Pesavento, Shail Srinivas, Yanjun Ma, Terry Hass, Kambiz Rahimi
  • Publication number: 20040004861
    Abstract: An electrically erasable programmable read only memory (EEPROM) cell that uses differential pFET floating-gate transistors as its core.
    Type: Application
    Filed: July 5, 2002
    Publication date: January 8, 2004
    Applicant: Impinj, Inc. A Delware Corporation
    Inventors: Shail Srinivas, Chad Lindhorst, Yanjun Ma, Terry Haas, Kambiz Rahimi, Christopher J. Diorio