Abstract: An electronic device with a detachable cover comprises a main body, a cover connected to the main body, and a spring. The main body forms an opening, wherein a flange extends inwardly from an upper edge of the opening, and a first locking portion protrudes from an edge of the main body. And the cover comprises a base plate, a sliding member, and a rotating member. The base plate is received in the opening and is supported by the flange comprising an protruding tab engaging the edge of the main body and a first recess. The sliding member is slidably connected to the base plate, and comprises a second locking portion with a second recess and a first engagement member. The rotating member rotatably connected to the base plate, and comprises a second engagement member. The spring comprises a base portion and two deflected spring arms.

Abstract: An exemplary insert molding article includes an elastomer element and an insert element. The insert element defines a plurality of through holes thereon. The elastomer element covers one side surface of the insert element and fills the through holes of the insert element. Methods for making the insert molding article are also provided.

Abstract: A method and apparatus for scan design architecture with non-scan testing cost is disclosed. In one embodiment, the method comprises: transforming a plurality of sequential cells for a sequential circuit to a plurality of controllable and observable cells for a combinational circuit; connecting said plurality of sequential cells with at least one shifter registers; obtaining at least one scan chains; and substituting the ATPG step for said sequential circuit with the ATPG for said combinational circuit. In another embodiment, the apparatus comprises: means for transforming a plurality of sequential cells for a sequential circuit to a plurality of controllable and observable cells for a combinational circuit; means for connecting said plurality of sequential cells with at least one shifter registers; means for obtaining at least one scan chains; and means for substituting the ATPG step for said sequential circuit with the ATPG for said combinational circuit.

Abstract: A method and apparatus for scan design architecture with non-scan testing cost is disclosed. In one embodiment, the method comprises: transforming a plurality of sequential cells for a sequential circuit to a plurality of controllable and observable cells for a combinational circuit; connecting said plurality of sequential cells with at least one shifter registers; obtaining at least one scan chains; and substituting the ATPG step for said sequential circuit with the ATPG for said combinational circuit. In another embodiment, the apparatus comprises: means for transforming a plurality of sequential cells for a sequential circuit to a plurality of controllable and observable cells for a combinational circuit; means for connecting said plurality of sequential cells with at least one shifter registers; means for obtaining at least one scan chains; and means for substituting the ATPG step for said sequential circuit with the ATPG for said combinational circuit.