Abstract: A method of forming a component includes providing a work-piece blank from a formable material. The method also includes engaging the work-piece blank with a transfer device. The method additionally includes austenitizing the work-piece blank in the transfer device via heating the blank to achieve austenite microstructure therein. The method also includes transferring the austenitized blank to a forming press using the transfer device. The method additionally includes forming the component via the forming press from the austenitized blank and quenching the formed component. A work-piece blank transfer system includes a transfer device having clamping arm(s) for engaging, holding, transferring, and releasing the work-piece blank. The transfer device also includes a heating element configured to austenitize the work-piece blank via heating the blank to achieve austenite microstructure therein.

Abstract: A steel composition is provided. The steel composition includes 0.1-0.45 wt. % carbon (C), greater than 0-4.5 wt. % manganese (Mn), 0.5-5 wt. % chromium (Cr), 0.5-2.5 wt. % silicon (Si), greater than 0-2 wt. % copper (Cu), and a balance of iron (Fe). The combined concentration of the Mn, Cr, and Cu is greater than about 2 wt. %. The steel composition is configured to form a surface oxide layer comprising oxides of Cr, Si, and Cu after being subjected to press hardening. Press-hardened steel fabricated from the steel composition and a method of fabricating a press-hardened steel component from the steel composition are also provided.

Abstract: A draper header has a transverse main frame supporting center, left side and right side belt conveyors and including a plurality of transversely spaced knife support members that extend forwardly beneath the belt conveyors from right and left lower rear main frame members and have forward ends on which a transversely extending knife is supported. Each belt conveyor includes a frame disposed within an endless belt and having a rear side hinged to a respective lower rear main frame member for pivoting upwardly between operating and belt-changing positions. Brackets are removably fixed across the length of the knife and have rear edges extending above front edges of the belts when the conveyors are in their operating positions. At least one height adjuster is mounted between the main frame and each conveyor frame for moving each conveyor to its belt-changing position once the associated brackets are removed from the knife.

Abstract: An infrared imaging system used for providing images from a plurality of views. The multiple view infrared imaging system includes a plurality of lens and infrared focal plane array (FPA) pairings, wherein each pairing can be used to provide an image and/or sample scene data of a distinct view. A single set of processing circuitry and a single set of one or more output elements may be utilized to provide such images. A multi-input switch may be utilized in combination with the single set of processing circuitry and output elements to provide images from any of the lens and FPA pairings based on the positioning of the switch.

Abstract: Methods and systems for correcting fixed pattern noise (FPN) in infrared (IR) imaging cameras. The methods and systems include correcting IR sensor data different strength levels of FPN data and selecting the particular strength level that produces corrected data with the least amount of FPN. The correction may occur over several frames of IR sensor data in order to find an optimal strength level for correction.

Abstract: A method of scheduling offset compensation for an infrared (IR) imaging system to maintain good image quality. The method includes a scheduling algorithm for automatic offset compensation. The scheduling algorithm automatically adjusts periods between offset compensations based on the measurement of drift of the focal plane array (FPA) pixel levels. As a result, the periods are adjusted both when the camera is thermally stable and when the camera is undergoing an internal thermal change.

Abstract: A method of scheduling offset compensation for an infrared (IR) imaging system to maintain good image quality. The method includes a scheduling algorithm for automatic offset compensation. The scheduling algorithm automatically adjusts periods between offset compensations based on the measurement of drift of the focal plane array (FPA) pixel levels. As a result, the periods are adjusted both when the camera is thermally stable and when the camera is undergoing an internal thermal change.

Abstract: A microbolometer imaging apparatus having an array of selectable substrate-isolated microbolometer detectors, a detector selection controller, and a readout circuit. The detectors may be exposed to a scene of interest, and each detector has a corresponding resistor value. The detector selection controller may selectively couple an electrical bias source to each detector. The readout circuit may establish an output signal representative of the resistance value of each detector. The readout circuit includes a feedback bias control circuit modulates the electrical bias source as a function of the output signal.

Abstract: An infrared imaging system used for providing images from a plurality of views. The multiple view infrared imaging system includes a plurality of lens and infrared focal plane array (FPA) pairings, wherein each pairing can be used to provide an image and/or sample scene data of a distinct view. A single set of processing circuitry and a single set of one or more output elements may be utilized to provide such images. A multi-input switch may be utilized in combination with the single set of processing circuitry and output elements to provide images from any of the lens and FPA pairings based on the positioning of the switch.

Abstract: A readout circuit for an array of substrate-isolated microbolometer detectors includes a bias source that varies in accordance with changes in substrate temperature as detected by a temperature sensor that has temperature characteristic that resembles the temperature characteristic of the microbolometer detector array so as compensate detector measurements for temperature induced errors in the microbolometer focal plane array read out.

Abstract: A readout circuit for an array of substrate-isolated microbolometer detectors includes a bias source that varies in accordance with changes in substrate temperature as detected by a temperature sensor that has temperature characteristic that resembles the temperature characteristic of the microbolometer detector array so as compensate detector measurements for temperature induced errors in the microbolometer focal plane array read out.

Abstract: A readout circuit for an array of substrate-isolated microbolometer detectors includes a bias source that varies in accordance with changes in substrate temperature as detected by a temperature sensor that has temperature characteristic that resembles the temperature characteristic of the microbolometer detector array so as compensate detector measurements for temperature induced errors in the microbolometer focal plane array read out.

Abstract: A method and apparatus for controlling bias for an microbolometer focal plane array which includes use of one thermally-shorted microbolometer detector thermally shorted to the substrate upon which one or more thermally-isolated microbolometers are constructed. A calibration bias source magnitude is determined and continually adjusted as a function of (i) the temperature related reading value of the resistance of the thermally-shorted microbolometer at calibration, and (ii) the temperature related reading value of the resistance of the thermally-shorted microbolometer after each image sample is taken.

Abstract: A method and apparatus for controlling bias for an microbolometer focal plane array which includes use of one thermally-shorted microbolometer detector thermally shorted to the substrate upon which one or more thermally-isolated microbolometers are constructed. A calibration bias source magnitude is determined and continually adjusted as a function of (i) the temperature related reading value of the resistance of the thermally-shorted microbolometer at calibration, and (ii) the temperature related reading value of the resistance of the thermally-shorted microbolometer after each image sample is taken.

Abstract: A method and apparatus for controlling bias for an microbolometer focal plane array which includes use of one thermally-shorted microbolometer detector thermally shorted to the substrate upon which one or more thermally-isolated microbolometers are constructed. A calibration bias source magnitude is determined and continually adjusted as a function of (i) the temperature related reading value of the resistance of the thermally-shorted microbolometer at calibration, and (ii) the temperature related reading value of the resistance of the thermally-shorted microbolometer after each image sample is taken.