Patents by Inventor Shane M. Tysk

Shane M. Tysk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9030659
    Abstract: A spark-induced breakdown spectroscopy apparatus can have a housing with an inlet and an outlet that define an analyte flow path. A laser can define a laser pathway generally transverse to an intersecting the analyte flow path. A pair of electrodes, which can have insulating shields, can be mounted within the housing and can define a spark path. An optical detection element defines an optical path. The apparatus can be used to identify an aerosolized analyte.
    Type: Grant
    Filed: July 23, 2013
    Date of Patent: May 12, 2015
    Assignee: Massachusetts Institute of Technology
    Inventors: Shane M. Tysk, John P. D'Angelo, William D. Herzog
  • Publication number: 20150029505
    Abstract: A spark-induced breakdown spectroscopy apparatus can have a housing with an inlet and an outlet that define an analyte flow path. A laser can define a laser pathway generally transverse to an intersecting the analyte flow path. A pair of electrodes, which can have insulating shields, can be mounted within the housing and can define a spark path. An optical detection element defines an optical path. The apparatus can be used to identify an aerosolized analyte.
    Type: Application
    Filed: July 23, 2013
    Publication date: January 29, 2015
    Applicant: Massachusetts Institute of Technology
    Inventors: Shane M. Tysk, John P. D'Angelo, William D. Herzog
  • Patent number: 7772579
    Abstract: Particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the various portions of the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
    Type: Grant
    Filed: May 18, 2007
    Date of Patent: August 10, 2010
    Assignee: Massachusetts Institute of Technology
    Inventors: William D. Herzog, Antonio Sanchez-Rubio, Gregory G. Cappiello, Ronald H. Hoffeld, Shane M. Tysk, Vincenzo Daneu, Thomas H. Jeys