Abstract: Provided is a light-emitting quantum dot coated with at least one blue-light absorption layer, including an alloy core consisting of Cd, Se, Zn, and S, at least one first shell layer which has a wurtzite structure and is coated on a surface of the alloy core; and a second shell layer consisting of ZnS and, having a zinc blende structure and is coated on a surface of the first shell layer, wherein the element ratio of each of Zn and S accounts for 30 to 50% of the overall core, and the content of Cd and Se gradually decreases outward from the core center. Also provided is a method for preparing the core-shell type light-emitting quantum dot.

Abstract: An integrated circuit package and a method of forming the same are provided. The method includes attaching an integrated circuit die to a first substrate. A dummy die is formed. The dummy die is attached to the first substrate adjacent the integrated circuit die. An encapsulant is formed over the first substrate and surrounding the dummy die and the integrated circuit die. The encapsulant, the dummy die and the integrated circuit die are planarized, a topmost surface of the encapsulant being substantially level with a topmost surface of the dummy die and a topmost surface of the integrated circuit die. An interior portion of the dummy die is removed. A remaining portion of the dummy die forms an annular structure.

Abstract: A display detection device includes a panel, a detection board, and a detection adapter board. The panel is configured to display. The detection board is coupled to the panel, and is configured to input a detection signal. The detection adapter board is coupled to the panel, and is configured to respond to the detection signal to generate a detection result.

Abstract: A method including: providing a design data of an integrated circuit (IC), the design data comprising a first cell; identifying a first conductive line in the first cell as a critical internal net of the first cell, wherein the first conductive line is electrically connected between an input terminal of the first cell and an output terminal of the first cell; providing a library of the first cell, wherein the library includes a table of timing or power parameters of the first cell based on a multidimensional input set associated with the critical internal net; updating the design data by determining a timing or power value of the first cell based on the table; performing a timing analysis on the updated design data; and forming a photomask based on the updated design data.

Abstract: A method is provided. The method includes determining a first hotspot region of a contact structure map. The method includes enlarging, according to a first predefined enlargement profile, the first hotspot region to determine a first enlarged region of the contact structure map. The method includes determining that a first portion of the first enlarged region overlaps a functional region of a functional component. The method includes determining a cropped region, of the contact structure map, that excludes the first portion of the first enlarged region. The method includes updating a first patterned oxide layer map based upon the cropped region to generate an updated patterned oxide layer map.

Abstract: An antenna device includes a differential-line, a first metal and a second metal. The differential-line includes a first line and a second line. The first metal and second metal are coupled to the first line and second line respectively. The first metal and second metal have different shapes and/or different sizes. The first metal and second metal form symmetric or asymmetric dipole. The first metal and second metal can be disposed on the same plane or different planes, can be electrically insulated and can have a first slot and a second slot respectively. The antenna device can further include a base coupled to the first line and second line. The base can be a daughter board having a front-end module or not. The IC package in daughter board can have different sizes. The daughter board can be offset by different distances and can be coupled to a mother board.

Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: Some implementations described herein provide a reticle cleaning device and a method of use. The reticle cleaning device includes a support member configured for extension toward a reticle within an extreme ultraviolet lithography tool. The reticle cleaning device also includes a contact surface disposed at an end of the support member and configured to bond to particles contacted by the contact surface. The reticle cleaning device further includes a stress sensor configured to measure an amount of stress applied to the support member at the contact surface. During a cleaning operation in which the contact surface is moving toward the reticle, the stress sensor may provide an indication that the amount of stress applied to the support member satisfies a threshold. Based on satisfying the threshold, movement of the contact surface and/or the support member toward the reticle ceases to avoid damaging the reticle.

Abstract: A semiconductor device and method of manufacturing the same are provided. The semiconductor device includes a substrate and a capacitor structure. The capacitor structure is disposed on the substrate. The capacitor structure includes a first electrode and a plurality of second electrodes. At least one of the plurality of second electrodes is embedded within the first electrode.

Abstract: In a method of generating extreme ultraviolet (EUV) radiation in a semiconductor manufacturing system one or more streams of a gas is directed, through one or more gas outlets mounted over a rim of a collector mirror of an EUV radiation source, to generate a flow of the gas over a surface of the collector mirror. The one or more flow rates of the one or more streams of the gas are adjusted to reduce an amount of metal debris deposited on the surface of the collector mirror.

Abstract: A semiconductor device structure, along with methods of forming such, are described. The structure includes a first channel region disposed over a substrate, a second channel region disposed adjacent the first channel region, a gate electrode layer disposed in the first and second channel regions, and a first dielectric feature disposed adjacent the gate electrode layer. The first dielectric feature includes a first dielectric material having a first thickness. The structure further includes a second dielectric feature disposed between the first and second channel regions, and the second dielectric feature includes a second dielectric material having a second thickness substantially less than the first thickness. The second thickness ranges from about 1 nm to about 20 nm.

Abstract: The present disclosure provides a sub-assembly of a medicament delivery device, the sub-assembly comprising: a tubular housing, a carrier, a cap, and a carrier retracting assembly. The tubular housing extends along a longitudinal axis between a distal end and a proximal end, and the cap is removably attached to the tubular housing and at least partially enclosing the carrier. The carrier is configured to receive a medicament container of the medicament delivery device. The carrier is movable relative to the tubular housing in the direction of the longitudinal axis from a proximal position where the carrier is at least partially arranged within the tubular housing to a distal position where the carrier is further into the tubular housing by the carrier retracting assembly during a removal of the cap from the tubular housing.

Abstract: A semiconductor structure includes a substrate with fin features extending along a first direction; a plurality of gate stacks and a plurality of dummy pillars. The gate stacks are deposited over the substrate and extend along a second direction different from the first direction to cover the sidewalls and top surfaces of the fin features exposed from the substrate. Each gate stack includes a first gate region, a second gate region and a central region formed between the first gate region and the second gate region without covering the fin features. The dummy pillars are formed in the gate stacks besides the fin features and/or on the fin features.

Abstract: Methods, systems, and devices for providing computer implemented services are disclosed. To provide the computer implemented services, an identification of a startup of a data processing system may be made. Based on the identification, a determination may be made regarding whether a device is present in an expansion slot of the data processing system. If the device is present, then another determination may be made regarding whether identification information is able to be obtained from the device. If obtained, the identification information may be interpreted to obtain communication link bifurcation settings for the device. Default communication link training settings may then be updated based on the bifurcation settings to obtain updated training settings. Communication link training may then be initiated for a communication link using the updated training settings.

Abstract: Some implementations described herein provide a reticle cleaning device and a method of use. The reticle cleaning device includes a support member configured for extension toward a reticle within an extreme ultraviolet lithography tool. The reticle cleaning device also includes a contact surface disposed at an end of the support member and configured to bond to particles contacted by the contact surface. The reticle cleaning device further includes a stress sensor configured to measure an amount of stress applied to the support member at the contact surface. During a cleaning operation in which the contact surface is moving toward the reticle, the stress sensor may provide an indication that the amount of stress applied to the support member satisfies a threshold. Based on satisfying the threshold, movement of the contact surface and/or the support member toward the reticle ceases to avoid damaging the reticle.

Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: A blockchain network, in which each node is able to be dynamically assigned different function for a given transaction that can be executed in parallel, includes a first node configured to send a transaction validation request for a transaction using a peer-to-peer (P2P) network; and a second node, configured to validate the transaction in response to the transaction validation request from the first node, and further configured to inform the first node of an approval of the transaction using a P2P network in response to the validation. The first node sends a notification message indicating completion of the transaction to a third node using a P2P network in response to the approval.

Abstract: A semiconductor device package includes a first carrier, a first electronic component, a second electronic component, a second carrier and an electrical connection structure. The first carrier has a first surface and a second surface opposite to the first surface. The first electronic component is disposed on the first surface of the first carrier. The second electronic component is disposed on the second surface of the first carrier. The second carrier has a first surface facing the second surface of the first carrier and a second surface opposite to the first surface. The electrical connection structure is electrically connecting the first carrier with the second carrier.

Abstract: A semiconductor device structure and method for forming the same are provided. The semiconductor device structure includes an interconnect structure formed over a substrate and a passivation layer formed over the interconnect structure. The semiconductor device structure also includes an anti-acid layer formed in the passivation layer and a bonding layer formed on the anti-acid layer and the passivation layer. The anti-acid layer has a thickness that is greater than about 140 nm.

Abstract: A semiconductor device package includes a first carrier, a first electronic component, a second electronic component, a second carrier and an electrical connection structure. The first carrier has a first surface and a second surface opposite to the first surface. The first electronic component is disposed on the first surface of the first carrier. The second electronic component is disposed on the second surface of the first carrier. The second carrier has a first surface facing the second surface of the first carrier and a second surface opposite to the first surface.