Patents by Inventor Shang Hou

Shang Hou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100239588
    Abstract: The present invention discloses the functional epitope of osteopontin; the anti-osteopontin monoclonal antibody and immune conjugate raising against the functional epitope and their use for preparing anti-tumor drug. The present invention also discloses the DNA sequence encoding the monoclonal antibody, the vector and host cell containing the DNA sequence. The monoclonal antibody and immune conjugate of present invention can also be used to detect OPN. Through inhibiting OPN, the monoclonal antibody or immune conjugate of present invention can remedy or respite autoimmune diseases and protect correlative tissues, so they can be used to remedy autoimmune diseases.
    Type: Application
    Filed: March 25, 2008
    Publication date: September 23, 2010
    Applicant: Shanghai National Engineering Research Center of Antibody Medicine Co.
    Inventors: Yajun Guo, Jianxin Dai, Hao Wang, Geng Kou, Shang Hou, Weizhu Qian, Kexing Fan
  • Publication number: 20100151486
    Abstract: Provided are functional epitopes of osteopontin (OPN), monoclonal antibodies that specifically bind to the epitopes, immunoconjugates comprising the monoclonal antibodies and use of the monoclonal antibodies or immunoconjugates for manufacturing a medicament for the treatment of tumor. Also provided are nucleotide sequences encoding the monoclonal antibodies and vectors and host cells comprising the sequences. The monoclonal antibodies or immunoconjugates can be used for detecting the OPN, blocking the promoting metastasis-signaling pathway mediated by OPN and preventing the development and metastasis of tumor, thereby inhibiting the tumor.
    Type: Application
    Filed: March 25, 2008
    Publication date: June 17, 2010
    Applicant: SHANGHAI NATIONAL ENGINEERING RESEARCH CENTER OF A
    Inventors: Yajun Guo, Jianxin Dai, Hao Wang, Geng Kou, Shang Hou, Weizhu Qian, Ling Peng
  • Publication number: 20060261490
    Abstract: A multi-layered semiconductor structure with free areas limiting the placement of test keys. First and second scribe lines intersect to define one corner point of a die. The first and second scribe lines are part of the multilayered structure and at least one layer of the multi-layer structure is a low-k dielectric layer. Free area A1 is defined on the first scribe line and is defined by the equation A1=D1×S1, where D1 is the distance from the corner point of the die toward the main area of the die, and S1 is the width of the first scribe line. Free area AS is defined at the intersection of the first scribe line and the second scribe line adjacent the die and is defined by the equation AS=S1×S2, where S2 is the width of the second scribe line.
    Type: Application
    Filed: July 28, 2006
    Publication date: November 23, 2006
    Inventors: Chao-Yuan Su, Pei-Haw Tsao, Hsin-Hui Lee, Chender Huang, Shang Hou, Shin Jeng, Hao-Yi Tsai, Chenming Hu