Patents by Inventor Shangang Zhang

Shangang Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230350744
    Abstract: In various examples, a system comprising at least one circuit to detect whether a fault has occurred during performance of an operation by the at least one circuit. In at least some embodiments, the at least one circuit generates error detecting values and determines a fault has occurred when the error detecting values do not match predetermined error detecting data.
    Type: Application
    Filed: December 1, 2022
    Publication date: November 2, 2023
    Inventors: Rongzhe Zhu, Shangang Zhang, Nagaraju Balasubramanya, Jinyue Lu, Tinghai Miao
  • Patent number: 11726857
    Abstract: Apparatuses, systems, and techniques to detect faults in processing pipelines are described. One accelerator circuit includes a fixed-function circuit that performs an operation corresponding to a layer of a neural network. The fixed-function circuit includes a set of homogeneous processing units and a fault scanner circuit. The fault scanner circuit includes an additional homogeneous processing unit to scan each processing unit of the set for functional faults in a sequence.
    Type: Grant
    Filed: July 13, 2021
    Date of Patent: August 15, 2023
    Assignee: NVIDIA Corporation
    Inventors: Yilin Zhang, Shangang Zhang, Yan Zhou, Qifei Fan
  • Publication number: 20220374298
    Abstract: Apparatuses, systems, and techniques to detect faults in processing pipelines are described. One accelerator circuit includes a fixed-function circuit that performs an operation corresponding to a layer of a neural network. The fixed-function circuit includes a set of homogeneous processing units and a fault scanner circuit. The fault scanner circuit includes an additional homogeneous processing unit to scan each processing unit of the set for functional faults in a sequence.
    Type: Application
    Filed: July 13, 2021
    Publication date: November 24, 2022
    Inventors: Yilin Zhang, Shangang Zhang, Yan Zhou, Qifei Fan