Abstract: An antenna attitude fast measurement system and a method are provided. The measurement system includes a data processing unit, a stereo calibration unit, at least two detector measurement units, and a plurality of target marker units; the target marker unit is arranged on the back of the antenna main reflector of the antenna system to be measured; the detector measurement unit is arranged outside the circumference of the antenna system to be measured; and the stereo calibration unit is arranged directly below the center of the antenna main reflector of the antenna system to be measured. Any two adjacent detector measurement units have a field-of-view intersection area, and there is at least one target marker unit within the field-of-view intersection area. The total number of target marker units in all field-of-view intersection areas is ?3. The data processing unit is electrically connected to the detector measurement unit.

Abstract: A wafer-scale linear image sensor chip (WLISC) is proposed with gapless pixel line and signal readout circuit segments. The WLISC converts pixel line image (PLI) of length LPL into line image signal (LIS). The WLISC includes a linear array of sensor segments. Each sensor segment includes a gapless local pixel line segment (LPLSj) of sensing elements. The LPLSj converts portion of the PLI into a raw image segment signal set (RISSj). The LPLSj set forms a gapless global pixel line (GPL) corresponding to PLI. The sensor segment also includes readout circuit segment (RCSj) coupled to LPLSj for processing RISSj into a readout image segment signal set (ROSSj). The RCSj has a set of contact pads (CTPj) for off-chip interconnection. Upon off-chip interconnection of the CTPj set thus composing the ROSSj set into LIS, the WLISC functions as a key part of a linear image sensor system of image length LPL.