Abstract: In product testing, a script prioritization tool (102) is used to intelligently prioritize the execution sequence of test scripts. This tool creates a repository of test outputs from the executions of test scripts and analyzes the outputs to train and deploy a machine learning, ML, model that defines the priority of the scripts that may need to be executed and the scripts whose execution may be skipped without affecting the quality of testing. Scripts that are more likely to fail and/or are time consuming to execute are prioritized, while other scripts may be skipped. The ML model ranks the scripts based on the average execution time of the script, a count of the execution failures of the script, a count of the number of execution retries for the script, and the most recent failure time of the script. The scripts can be executed based on their rankings for efficiency and time-saving.

Abstract: Methods, information handling systems and computer readable media are disclosed for formulating a proposed action involving a current repair process for a failed product in a manufacturing process. According to one embodiment, a method includes receiving identification of a current repair process and associating a first set of parameter values with the current repair process. The method further includes determining a likelihood of shipment delay resulting from the current repair process, where the determining includes applying a first machine learning model to the first set of parameter values. Based on the likelihood of shipment delay, the method further includes formulating a proposed action, including at least one of waiting for completion of the current repair process, replacing the failed product with an alternative product undergoing the manufacturing process, or initiating production of a new product to replace the failed product.

Abstract: A system for testing electrical components comprising a supplier test system operating on a first processor and configured to generate test data for a component and to store the component test data on a block chain. A board level test system operating on a second processor and configured to generate test data for a board and to store the board test data on the block chain. A test tracking system configured to request a first key to access to the component test data and a second key to access the board test data and to store the first key and the second key.

Abstract: An information handling system may include a processor and a memory communicatively coupled to the processor. The information handling system may be configured to: receive, for each of a plurality of target information handling systems, information regarding software to be burned to the respective target information handling system; receive, for each of the target information handling systems, information regarding testing time; based on a statistical analysis of the information regarding the testing time, determine a predicted burn time for each target information handling system; and based on the respective predicted burn times, determine a desired order in which the target information handling systems are to be burned with the software.

Abstract: An information handling system may include a processor and a memory communicatively coupled to the processor. The information handling system may be configured to: receive, for each of a plurality of target information handling systems, information regarding software to be burned to the respective target information handling system; receive, for each of the target information handling systems, information regarding testing time; based on a statistical analysis of the information regarding the testing time, determine a predicted burn time for each target information handling system; and based on the respective predicted burn times, determine a desired order in which the target information handling systems are to be burned with the software.

Abstract: A system for testing electrical components comprising a supplier test system operating on a first processor and configured to generate test data for a component and to store the component test data on a block chain. A board level test system operating on a second processor and configured to generate test data for a board and to store the board test data on the block chain. A test tracking system configured to request a first key to access to the component test data and a second key to access the board test data and to store the first key and the second key.