Patents by Inventor Shanker Bhagvat

Shanker Bhagvat has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for setting VDD on a per chip basis
    Patent number: 7532003
    Abstract: An integrated circuit test system. The test system includes a controller and an integrated circuit coupled to a voltage source and a current monitor. The controller causes the voltage source to supply a voltage to the integrated circuit, receives a signal from the current monitor indicating a power dissipation of the integrated circuit, and causes the voltage source to reduce the voltage until the signal from the current monitor indicates the power dissipation of the integrated circuit is less than a predetermined threshold. The controller stores in the integrated circuit in a non-volatile storage register that is accessible via a subset of access pins, a value corresponding to the voltage supplied to the integrated circuit when the power dissipation of the integrated circuit is less than the predetermined threshold. The subset of access pins provides at least one function in addition to accessing the non-volatile storage register.
    Type: Grant
    Filed: June 12, 2006
    Date of Patent: May 12, 2009
    Assignee: Sun Microsystems, Inc.
    Inventors: David J. Greenhill, Curtis R. McAllister, Thomas R. Caron, Shanker Bhagvat