Patents by Inventor Shanlin Duan

Shanlin Duan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7529049
    Abstract: Spinstand test improvement that measures Functional Byte Error Rate (F-BER) of a disk. The F-BER is correlated to the BER of a disk. The F-BER test is faster than a BER test. The F-BER test is incorporated into a spinstand tester or the software associated with a spinstand tester.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: May 5, 2009
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Shanlin Duan, Zhupei Shi, Li Tang, Jane Jie Zhang
  • Publication number: 20080137225
    Abstract: An apparatus, system, and method are disclosed for fly height detection. The apparatus includes an actuator configured to induce vibrations in a glide head that is configured to detect physical asperities on a disk surface. The apparatus may also include a second end of the suspension arm coupled with the glide head and a sensor module that is configured to communicate with a control module in response to the glide head coming in contact with at least one physical asperity. The system includes the apparatus, a disk having a surface comprising physical asperities, and a head gimbal assembly configured to calibrate a fly height margin for the disk. The method includes inducing vibrations in a glide head, detecting physical asperities on a disk surface, and communicating with a control module in response to the glide head coming in contact with at least one physical asperity.
    Type: Application
    Filed: December 12, 2006
    Publication date: June 12, 2008
    Inventors: Shanlin Duan, Jizhong He, John Stephen Hopkins
  • Publication number: 20080062549
    Abstract: Spinstand test improvement that measures Functional Byte Error Rate (F-BER) of a disk. The F-BER is correlated to the BER of a disk. The F-BER test is faster than a BER test. The F-BER test is incorporated into a spinstand tester or the software associated with a spinstand tester.
    Type: Application
    Filed: September 1, 2006
    Publication date: March 13, 2008
    Inventors: Shanlin Duan, Zhupei Shi, Li Tang, Jane Jie Zhang
  • Patent number: 7271967
    Abstract: A method for determining whether a spike in a read back signal from a read head positioned over a perpendicular recording disk having a magnetically soft underlayer (SUL) is caused by a defect in the SUL or by a thermal asperity (TA). A first read back signal with the spike is obtained in the absence of a local magnetic field near the read head. Then, a permanent magnet or electromagnet is used to induce a small local magnetic field by the read head, and a second signal is obtained. If the signals are substantially similar, a thermal asperity is indicated. Otherwise a defect in the 13 magnetically soft underlayer of the disk is indicated.
    Type: Grant
    Filed: October 28, 2004
    Date of Patent: September 18, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Zhupei Shi, Li Tang, Jane Jie Zhang, Shanlin Duan
  • Patent number: 7173415
    Abstract: A magnetic test module runs on a spin stand to detect amplitude decay and noise evolution at the same time. Signal-to-noise ratio (SNR) decay is directly measured. The recording performance is correlated better with SNR instead of signal only. The thermal stability of the system is evaluated more accurately with this SNR decay method. A heater is placed under the media disk, and a remote sensing thermometer and temperature controller form a subsystem to set up desired environmental temperature. The heater creates a heated band and the read/write head flies above the heated band. The temperature control system may be removed when SNR decay measurement is performed under room temperature.
    Type: Grant
    Filed: July 26, 2005
    Date of Patent: February 6, 2007
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Shanlin Duan, Jizhong He, Zhupei Shi, Jane Jie Zhang
  • Publication number: 20070024276
    Abstract: A magnetic test module runs on a spin stand to detect amplitude decay and noise evolution at the same time. Signal-to-noise ratio (SNR) decay is directly measured. The recording performance is correlated better with SNR instead of signal only. The thermal stability of the system is evaluated more accurately with this SNR decay method. A heater is placed under the media disk, and a remote sensing thermometer and temperature controller form a subsystem to set up desired environmental temperature. The heater creates a heated band and the read/write head flies above the heated band. The temperature control system may be removed when SNR decay measurement is performed under room temperature.
    Type: Application
    Filed: July 26, 2005
    Publication date: February 1, 2007
    Inventors: Shanlin Duan, Jizhong He, Zhupei Shi, Jane Zhang
  • Patent number: 7121133
    Abstract: A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second calibration point uses a spin down on disk media roughness at a second lower height. With two height data points, a fly height curve of each glide head is approximated very accurately. Once the fly height curve is derived for each head, any fly height can be dialed-in by the disk media certifier for glide testing. This technique achieves glide fly heights between about 4 nm and 8 nm and does so with improved tolerances.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: October 17, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Norman Chu, Shanlin Duan, Patricia Galindo, Hang Fai Ngo, Yu Lo, Nalin Zhou
  • Publication number: 20060092538
    Abstract: A method for determining whether a spike in a read back signal from a read head positioned over a perpendicular recording disk having a magnetically soft underlayer (SUL) is caused by a defect in the SUL or by a thermal asperity (TA). A first read back signal with the spike is obtained in the absence of a local magnetic field near the read head. Then, a permanent magnet or electromagnet is used to induce a small local magnetic field by the read head, and a second signal is obtained. If the signals are substantially similar, a thermal asperity is indicated. Otherwise a defect in the 13 magnetically soft underlayer of the disk is indicated.
    Type: Application
    Filed: October 28, 2004
    Publication date: May 4, 2006
    Inventors: Zhupei Shi, Li Tang, Jane Zhang, Shanlin Duan
  • Publication number: 20050262922
    Abstract: A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second calibration point uses a spin down on disk media roughness at a second lower height. With two height data points, a fly height curve of each glide head is approximated very accurately. Once the fly height curve is derived for each head, any fly height can be dialed-in by the disk media certifier for glide testing. This technique achieves glide fly heights between about 4 nm and 8 nm and does so with improved tolerances.
    Type: Application
    Filed: May 28, 2004
    Publication date: December 1, 2005
    Inventors: Norman Chu, Shanlin Duan, Patricia Galindo, Hang Ngo, Yu Lo, Nalin Zhou
  • Patent number: 6965229
    Abstract: A method is provided for testing a magnetoresistive sensor for polarity reversal. In one embodiment, the method includes: writing a test pattern on a magnetic disk; providing a mechanical or thermal stress to the magnetoresistive sensor for a period of time; and, comparing the polarity of the test pattern before and after the application of stress.
    Type: Grant
    Filed: August 1, 2003
    Date of Patent: November 15, 2005
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Shanlin Duan, Yan Liu, Li Tang
  • Publication number: 20050024046
    Abstract: A method is provided for testing a magnetoresistive sensor for polarity reversal. In one embodiment, the method includes: writing a test pattern on a magnetic disk; providing a mechanical or thermal stress to the magnetoresistive sensor for a period of time; and, comparing the polarity of the test pattern before and after the application of stress.
    Type: Application
    Filed: August 1, 2003
    Publication date: February 3, 2005
    Inventors: Shanlin Duan, Yan Liu, Li Tang
  • Patent number: 6771453
    Abstract: A calibration method for determining the flying height of a glide slider for disk glide height testing is disclosed. The method utilizes a disk with bumps in situ on a disk glide height tester. The method automatically takes into account disk topography, mounting tolerances, and slider roll.
    Type: Grant
    Filed: November 5, 2001
    Date of Patent: August 3, 2004
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Bradley Frederick Baumgartner, An-Chou Andrew Chen, Norman H. Chu, Shanlin Duan, Patricia Galindo, Roger Yu Lo, Connie H. Moy, Hang Fai Ngo
  • Patent number: 6662623
    Abstract: A disk for calibrating glide heads utilizes a dual-zone configuration of multiple laser melt bumps having selected heights. Averaging the PZT response over many bumps significantly narrows the response distribution, resulting in greater certainty and correlation of the PZT amplitude to bump height. The multiple calibration bumps are circumferentially arranged on a disk surface at a selected radius in a ring-like manner. A second head cleaning zone is provided near the inner diameter of the disk to provide for increased reproducibility of the PZT calibration response. The second zone is densely textured and serves to clean the glide head prior to its use in the calibration zone.
    Type: Grant
    Filed: September 20, 2001
    Date of Patent: December 16, 2003
    Assignee: International Business Machines Corporation
    Inventors: Bradley Frederick Baumgartner, James Hammond Brannon, Jorge Daniel Colonia, Huyen D. Do, Shanlin Duan, Connie H. Moy, Hang Fai Ngo, Yu Lo
  • Patent number: 6580266
    Abstract: An apparatus and method for detecting and marking delamination defects on thin film disks are disclosed. The apparatus includes a read/write (R/W) head and a burnishing head mounted on separate arms that access the disk while spinning on the test stand. The controller uses the R/W head to perform an initial magnetic test of selected areas on the disk to establish an initial defect map. The burnish head is then flown over the surface for an extended time to accelerate and open up the latent delamination defects by impacting protruding material. The R/W head is then used to perform a second magnetic test which is compared against the first test to identify the delamination defects which have been developed by the burnishing. The delamination defects are then marked with a magnetic pattern which aids in optically locating the defect during subsequent failure analysis.
    Type: Grant
    Filed: November 2, 2001
    Date of Patent: June 17, 2003
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Bradley Frederick Baumgartner, Shanlin Duan, Yan Liu, Bob C. Robinson, Li Tang, Ka Chi Wong
  • Publication number: 20030107830
    Abstract: An apparatus and method for detecting and marking delamination defects on thin film disks are disclosed. The apparatus includes a read/write (R/W) head and a burnishing head mounted on separate arms that access the disk while spinning on the test stand. The controller uses the R/W head to perform an initial magnetic test of selected areas on the disk to establish an initial defect map. The burnish head is then flown over the surface for an extended time to accelerate and open up the latent delamination defects by impacting protruding material. The R/W head is then used to perform a second magnetic test which is compared against the first test to identify the delamination defects which have been developed by the burnishing. The delamination defects are then marked with a magnetic pattern which aids in optically locating the defect during subsequent failure analysis.
    Type: Application
    Filed: December 7, 2001
    Publication date: June 12, 2003
    Inventors: Bradley Frederick Baumgartner, Shanlin Duan, Yan Liu, Bob C. Robinson, Li Tang, Ka Chi Wong
  • Publication number: 20030086197
    Abstract: A calibration method for determining the flying height of a glide slider for disk glide height testing is disclosed. The method utilizes a disk with bumps in situ on a disk glide height tester. The method automatically takes into account disk topography, mounting tolerances, and slider roll.
    Type: Application
    Filed: November 5, 2001
    Publication date: May 8, 2003
    Inventors: Bradley Frederick Baumgartner, An-Chou Andrew Chen, Norman H. Chu, Shanlin Duan, Patricia Galindo, Roger Yu Lo, Connie H. Moy, Hang Fai Ngo
  • Publication number: 20030085701
    Abstract: An apparatus and method for detecting and marking delamination defects on thin film disks are disclosed. The apparatus includes a read/write (R/W) head and a burnishing head mounted on separate arms that access the disk while spinning on the test stand. The controller uses the R/W head to perform an initial magnetic test of selected areas on the disk to establish an initial defect map. The burnish head is then flown over the surface for an extended time to accelerate and open up the latent delamination defects by impacting protruding material. The R/W head is then used to perform a second magnetic test which is compared against the first test to identify the delamination defects which have been developed by the burnishing. The delamination defects are then marked with a magnetic pattern which aids in optically locating the defect during subsequent failure analysis.
    Type: Application
    Filed: November 2, 2001
    Publication date: May 8, 2003
    Inventors: Bradley Frederick Baumgartner, Shanlin Duan, Yan Liu, Bob C. Robinson, Li Tang, Ka Chi Wong
  • Publication number: 20030051529
    Abstract: A disk for calibrating glide heads utilizes a dual-zone configuration of multiple laser melt bumps having selected heights. Averaging the PZT response over many bumps significantly narrows the response distribution, resulting in greater certainty and correlation of the PZT amplitude to bump height. The multiple calibration bumps are circumferentially arranged on a disk surface at a selected radius in a ring-like manner. A second head cleaning zone is provided near the inner diameter of the disk to provide for increased reproducibility of the PZT calibration response. The second zone is densely textured and serves to clean the glide head prior to its use in the calibration zone.
    Type: Application
    Filed: September 20, 2001
    Publication date: March 20, 2003
    Applicant: International Business Machines Corp.
    Inventors: Bradley Frederick Baumgartner, James Hammond Brannon, Jorge Daniel Colonia, Huyen D. Do, Shanlin Duan, Connie H. Moy, Hang Fai Ngo, Yu Lo
  • Patent number: 6530258
    Abstract: A bump disk for accurate glide calibration has a new type of glass laser melt bumps that give the same signal amplitudes as conventional AlMg laser melt bumps for the same bump height. The present invention provides a solution to switch the calibration bumps from AlMg to glass, and can be used in disk manufacturing lines to save 30% on the cost of hard disks from inaccurate glide certification processes. The solution is to trim or burnish away loose and/or high particles on production disks before the glide tests. This additional processing step causes the responses from the glass bumps to become very similar to those of the AlMg bumps, thereby enabling glass and AlMg disks to become materially compatible.
    Type: Grant
    Filed: July 23, 2001
    Date of Patent: March 11, 2003
    Assignee: International Business Machines Corporation
    Inventors: James Hammond Brannon, Shanlin Duan, Yu Lo
  • Patent number: 6526639
    Abstract: The disk burnishing process is conducted with a contact flying burnishing head wherein the leading edge of the burnishing head is disposed above the surface of the disk, while the trailing edge of the burnishing head makes contact with the surface of the disk. The contact flying configuration of the burnishing head is obtained by controlling the rotating disk RPM in conjunction with the burnishing head design characteristics. In the contact flying burnishing process, the burnishing edges of the several burnishing pads of the head are disposed at different heights relative to the disk surface, such that the leading burnishing pad edges are higher than the trailing burnishing pad edges. In this configuration, high asperities are trimmed by the burnishing pads while low asperities are not. Thus, a disk is properly burnished for subsequent hard disk drive performance with a minimum of surface debris being created by the burnishing process.
    Type: Grant
    Filed: August 30, 2001
    Date of Patent: March 4, 2003
    Assignee: International Business Machines Corporation
    Inventors: Shanlin Duan, Wei-Ming Lee, Yu Lo