Abstract: A gimbal assembly includes a gimbal and a slider. The slider has at least one adhesive receiving feature which is formed on a mounting surface of the slider. The gimbal has a lock feature including at least one body that protrudes from a slider-engaging surface and terminates at a first end. Each body of the lock feature engages each adhesive receiving feature of the slider.

Abstract: An electrical lap guide (ELG) and a method of using the same to control the machining of a surface of a magnetic transducer to obtain a desired transducer height are disclosed. The transducer and ELG are fabricated in a deposition of layers on a substrate. The ELG includes a first resistor aligned with the transducer such that a machined height of the first resistor is indicative of a machined height of the transducer. Resistances of second and third resistors of the ELG are measured. A sheet resistance of the deposition of layers and a quantity of wafer processing edge movement are determined as functions of the measured resistances of the second and third resistors. An expected non-machined resistance of the first resistor is determined as a function of the determined sheet resistance and as a function of the determined quantity of edge movement. A non-machined resistance of the first resistor is measured.

Abstract: A device for lapping a bar of the type which carries a plurality of sliders used in magnetic storage systems includes first, second and third actuators adapted to couple to the bar, and impart a first, second and third controllable force in response to a first, second and third control signal, respectively. An arm couples to the first, second and third actuators and applies a lapping force to the bar which presses the bar against a lapping surface thereby causing material to be removed from the bar. A controller provides the first, second and third control signals to the first, second and third actuators, respectively, to impart a plurality of forces onto the bar. The actuators are controlled to obtain a desired profile of the bar and to obtain a desired distribution of the lapping force across the profile of the bar.

Abstract: An electrical lap guide (ELG) system and method are disclosed for use in lapping a bar 10 of magnetic transducer carrying sliders to a desired transducer height. A first ELG ELG1 contained within the bar has at least two first ELG resistive elements R.sub.11 and R.sub.12. A second ELG ELG 2 contained within the bar has at least two second ELG resistive elements R.sub.21 and R.sub.23. A first of the at least two first ELG resistive elements is electrically coupled to a first of the at least two second ELG resistive elements to thereby reduce a total number of leads needed between a data acquisition unit 100 and the bar 10 during lapping. The reduction in required data acquisition unit 100 leads allow more ELGs to be included on each bar 10 in order to more accurately control the lapping process.

Abstract: An electrical lap guide (ELG) for use in lapping a bar of magnetic transducer carrying sliders to a desired height is disclosed. A first lapped or analog ELG element is positioned in a first dice lane on the bar between first and second sliders. A first electrical connection is positioned on a surface of the first dice lane for coupling the first ELG element to external circuitry. A second reference ELG element is positioned in the first slider at a position recessed from the lapped surface. A second electrical connection is positioned on the first slider for coupling the second ELG element to external circuitry.

Abstract: An electrical lap guide (ELG) and a method of using the same to control the machining of a surface of a magnetic transducer to obtain a desired transducer height are disclosed. The transducer and ELG are fabricated in a deposition of layers on a substrate. The ELG includes a first resistor aligned with the transducer such that a machined height of the first resistor is indicative of a machined height of the transducer. Resistances of second and third resistors of the ELG are measured. A sheet resistance of the deposition of layers and a quantity of wafer processing edge movement are determined as functions of the measured resistances of the second and third resistors. An expected non-machined resistance of the first resistor is determined as a function of the determined sheet resistance and as a function of the determined quantity of edge movement. A non-machined resistance of the first resistor is measured.

Abstract: A device for lapping a bar of the type which carries a plurality of sliders used in magnetic storage systems includes first, second and third actuators adapted to couple to the bar, and impart a first, second and third controllable force in response to a first, second and third control signal, respectively. An arm couples to the first, second and third actuators and applies a lapping force to the bar which presses the bar against a lapping surface thereby causing material to be removed from the bar. A controller provides the first, second and third control signals to the first, second and third actuators, respectively, to impart a plurality of forces onto the bar. The actuators are controlled to obtain a desired profile of the bar and to obtain a desired distribution of the lapping force across the profile of the bar.