Abstract: The present disclosure relates to a device and a system for testing flatness. The device for testing flatness includes a base, a testing platform, and a ranging sensor. The testing platform is assembled on the base. The testing platform includes a supporting structure. The supporting structure is disposed on the side of the testing platform away from the base and is used to support a to-be-tested board. The structure matches the structure of the to-be-tested board. The ranging sensor is disposed on the side of the testing platform away from the base. After the to-be-tested board is placed on the testing platform, the ranging sensor is used to test distances between a number N of to-be-tested positions on the to-be-tested board and the ranging sensor, to obtain N pieces of distance information, and the N pieces of distance information are used to determine the flatness of the to-be-tested board, where N is an integer greater than 2.

Abstract: A folding device is provided. The folding device includes a bearing and fixing mechanism (1) configured to bear and fix a main body portion (21) of a to-be-folded device (2); a folding mechanism (3) located on at least one side of the bearing and fixing mechanism (1), the folding mechanism (3) being rotatably connected to the bearing and fixing mechanism (1) and configured to bear and fix a to-be-folded portion (22) of the to-be-folded device (2); and a driving mechanism (4) connected to the folding mechanism (3), the driving mechanism (4) being configured to drive the folding mechanism (3) to turn relative to the bearing and fixing mechanism (1), so as to fold the to-be-folded portion (22) to a side in a thickness direction of the main body portion (21). The folding device can fold automatically, and manual folding is avoided.

Abstract: An image sensor comprising a substrate, a black pixel area formed in the substrate including a black pixel radiation sensing element. an active pixel area formed in the substrate, and a buffer area, wherein the black pixel area and the active pixel area sandwich the buffer area in a transverse direction of the substrate, and a first blocking wall that at least partially blocks the radiation propagating towards the black pixel radiation sensing element via the buffer area in the substrate is formed in the buffer area.

Abstract: Embodiments of the present invention disclose a phase shifting apparatus, including a first conductor section, a first tapping element, a feeder unit, and a dielectric element, where: the feeder unit is electrically connected to the first tapping element; the first tapping element is electrically connected to the first conductor section; the first tapping element is capable of moving along the first conductor section to change a phase of a signal that flows through the feeder unit, the first tapping element, and the first conductor section; and the dielectric element is disposed at a position near the first conductor section. With the phase shifting apparatus in the embodiments of the present invention, the dielectric element is disposed in order to increase an electrical length of a conductor, which correspondingly reduces a physical length of the conductor, so that the size of the phase shifting apparatus is reduced.

Abstract: Embodiments of the present invention disclose a phase shifting apparatus, including a first conductor section, a first tapping element, a feeder unit, and a dielectric element, where: the feeder unit is electrically connected to the first tapping element; the first tapping element is electrically connected to the first conductor section; the first tapping element is capable of moving along the first conductor section to change a phase of a signal that flows through the feeder unit, the first tapping element, and the first conductor section; and the dielectric element is disposed at a position near the first conductor section. With the phase shifting apparatus in the embodiments of the present invention, the dielectric element is disposed in order to increase an electrical length of a conductor, which correspondingly reduces a physical length of the conductor, so that the size of the phase shifting apparatus is reduced.