Patents by Inventor Shaowu Hu

Shaowu Hu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10712870
    Abstract: A method for improving fault tolerance of a touchscreen determines an abnormal node, and shield the abnormal node to improve the fault tolerance of the touchscreen. The method includes detecting a capacitance value of each node in the touchscreen, comparing the detected capacitance value of each node with a preset capacitance value of each node to determine N target nodes, where N is an integer greater than or equal to zero, and the target nodes are nodes whose capacitance values vary, determining whether an abnormal node is included in the N target nodes, where the abnormal node is a target node determined when no touch operation occurs on the touchscreen, and discarding a row value, a column value, and a capacitance variation value of the abnormal node when the abnormal node is included in the N target nodes.
    Type: Grant
    Filed: September 9, 2015
    Date of Patent: July 14, 2020
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Wenchao Xiao, Shaowu Hu, Gang Xu, Rui Zhang, Wushuang Jiang
  • Publication number: 20180275826
    Abstract: A method for improving fault tolerance of a touchscreen determines an abnormal node, and shield the abnormal node to improve the fault tolerance of the touchscreen. The method includes detecting a capacitance value of each node in the touchscreen, comparing the detected capacitance value of each node with a preset capacitance value of each node to determine N target nodes, where N is an integer greater than or equal to zero, and the target nodes are nodes whose capacitance values vary, determining whether an abnormal node is included in the N target nodes, where the abnormal node is a target node determined when no touch operation occurs on the touchscreen, and discarding a row value, a column value, and a capacitance variation value of the abnormal node when the abnormal node is included in the N target nodes.
    Type: Application
    Filed: September 9, 2015
    Publication date: September 27, 2018
    Inventors: Wenchao Xiao, Shaowu Hu, Gang Xu, Rui Zhang, Wushuang Jiang