Patents by Inventor Shaun Bradley
Shaun Bradley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12379433Abstract: Aspects of this disclosure relate to particles that can move in response to a magnetic field. A system can include a container, particles within the container, and a magnetic structure integrated with the container. The magnetic structure can magnetically interact with both an external magnetic field and the particles. Related methods are disclosed including magnetic field detection methods based on detection of particles within a container.Type: GrantFiled: September 6, 2023Date of Patent: August 5, 2025Assignee: Analog Devices International Unlimited CompanyInventors: Alan J. O'Donnell, Javier Calpe Maravilla, Shaun Bradley, Jan Kubík, Jochen Schmitt, Stanislav Jolondcovschi, Padraig L. Fitzgerald, Michael P. Lynch, Alfonso Berduque, Gavin Patrick Cosgrave, Eoin Edward English
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Patent number: 12282059Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.Type: GrantFiled: May 16, 2024Date of Patent: April 22, 2025Assignee: Analog Devices International Unlimited CompanyInventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
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Publication number: 20240405517Abstract: Apparatuses including spark gap structures for electrical overstress (EOS) monitoring or protection, and associated methods, are disclosed. In an aspect, a spark gap array includes a sheet resistor and an array of arcing electrode pairs formed over a substrate. The array of arcing electrode pairs includes first arcing electrodes formed on the sheet resistor and a second arcing electrode arranged as a sheet formed over the first arcing electrodes and separated from the first arcing electrodes by an arcing gap. The first arcing electrodes and second arcing electrode are electrically connected to first and second voltage nodes, respectively, and the arcing electrode pairs are configured to generate arc discharges in response to an EOS voltage signal received between the first and second voltage nodes.Type: ApplicationFiled: May 30, 2024Publication date: December 5, 2024Inventors: David J. Clarke, Alan J. O'Donnell, Shaun Bradley, Stephen Denis Heffernan, Patrick Martin McGuinness, Padraig L. Fitzgerald, Edward John Coyne, Michael P. Lynch, John Anthony Cleary, John Ross Wallrabenstein, Paul Joseph Maher, Andrew Christopher Linehan, Gavin Patrick Cosgrave, Michael James Twohig, Jan Kubik, Jochen Schmitt, David Aherne, Mary McSherry, Anne M. McMahon, Stanislav Jolondcovschi, Cillian Burke
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Publication number: 20240405519Abstract: Apparatuses including spark gap structures for electrical overstress (EOS) monitoring or protection, and associated methods, are disclosed. In an aspect, a vertical spark gap device includes a substrate having a horizontal main surface, a first conductive layer and a second conductive layer each extending over the substrate and substantially parallel to the horizontal main surface while being separated in a vertical direction crossing the horizontal main surface. One of the first and second conductive layers is electrically connected to a first voltage node and the other of the first and second conductive layers is electrically connected to a second voltage node. The first and second conductive layers serve as one or more arcing electrode pairs and have overlapping portions configured to generate one or more arc discharges extending generally in the vertical direction in response to an EOS voltage signal received between the first and second voltage nodes.Type: ApplicationFiled: May 30, 2024Publication date: December 5, 2024Inventors: David J. Clarke, Alan J. O'Donnell, Shaun Bradley, Stephen Denis Heffernan, Patrick Martin McGuinness, Padraig L. Fitzgerald, Edward John Coyne, Michael P. Lynch, John Anthony Cleary, John Ross Wallrabenstein, Paul Joseph Maher, Andrew Christopher Linehan, Gavin Patrick Cosgrave, Michael James Twohig, Jan Kubik, Jochen Schmitt, David Aherne, Mary McSherry, Anne M. McMahon, Stanislav Jolondcovschi, Cillian Burke
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Publication number: 20240405518Abstract: Apparatuses including spark gap structures for electrical overstress (EOS) monitoring or protection, and associated methods, are disclosed. In an aspect, a spark gap device includes first and second conductive layers formed over a substrate, where the first and second conductive layers are electrically connected to first and second voltage nodes, respectively. The first conductive layer includes a plurality of arcing tips configured to form arcing electrode pairs with the second conductive layer to form an arc discharge in response to an EOS voltage between the first and second voltage nodes. The spark gap device further includes a series ballast resistor electrically connected between the arcing tips and the first voltage node, where the ballast resistor in formed in a metallization layer over the substrate and a resistance of the series ballast resistor is substantially higher than a resistance of the second conductive layer.Type: ApplicationFiled: May 30, 2024Publication date: December 5, 2024Inventors: David J. Clarke, Alan J. O'Donnell, Shaun Bradley, Stephen Denis Heffernan, Patrick Martin McGuinness, Padraig L. Fitzgerald, Edward John Coyne, Michael P. Lynch, John Anthony Cleary, John Ross Wallrabenstein, Paul Joseph Maher, Andrew Christopher Linehan, Gavin Patrick Cosgrave, Michael James Twohig, Jan Kubik, Jochen Schmitt, David Aherne, Mary McSherry, Anne M. McMahon, Stanislav Jolondcovschi, Cillian Burke
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Publication number: 20240377091Abstract: The present disclosure includes a heating, ventilation, and/or air-conditioning (HVAC) control system with a controller and a device communicatively coupled to the controller. The device is configured to implement an engagement protocol, wherein to grant the controller write access to protected registers of the device the engagement protocol functions to require: receiving a reset command at a reset register of the device; receiving a passcode at a passcode register of the device; matching the passcode received at the passcode register to an authentication passcode; and receiving or matching the passcode within a timeframe defined by a timer.Type: ApplicationFiled: May 10, 2023Publication date: November 14, 2024Inventors: Shelby Mitchell, Shaun Bradley Atchison
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Publication number: 20240377453Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.Type: ApplicationFiled: May 16, 2024Publication date: November 14, 2024Inventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
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Publication number: 20240298405Abstract: A circuit board includes a first non-conductive layer and a second non-conductive layer. Additionally, the circuit board includes a first electronic component. The circuit board is configurable to operate in a first configuration with a second electronic component, and the circuit board is configurable to operate in a second configuration with a third electronic component instead of the second electronic component. Furthermore, the circuit board includes a first trace layer disposed on the first non-conductive layer. The first trace layer is configured to electrically couple the first electronic component to the second electronic component in a first configuration of the circuit board. Additionally, the circuit board includes a second trace layer disposed between the first non-conductive layer and the second non-conductive layer. The second trace layer is configured to electrically couple the first electronic component to the third electronic component in a second configuration of the circuit board.Type: ApplicationFiled: March 1, 2024Publication date: September 5, 2024Inventor: Shaun Bradley Atchison
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Patent number: 12055569Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes.Type: GrantFiled: May 15, 2023Date of Patent: August 6, 2024Assignee: Analog Devices International Unlimited CompanyInventors: David J. Clarke, Stephen Denis Heffernan, Nijun Wei, Alan J. O'Donnell, Patrick Martin McGuinness, Shaun Bradley, Edward John Coyne, David Aherne, David M. Boland
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Publication number: 20240210495Abstract: Aspects of this disclosure relate to one or more particles that move within a container in response to a magnetic field. A measurement circuit is configured to output an indication of the magnetic field based on position of the one or more particles.Type: ApplicationFiled: March 7, 2024Publication date: June 27, 2024Inventors: Alan J. O'Donnell, Javier Calpe Maravilla, Alfonso Berduque, Shaun Bradley, Jochen Schmitt, Jan Kubík, Stanislav Jolondcovschi, Padraig L. Fitzgerald, Eoin Edward English, Gavin Patrick Cosgrave, Michael P. Lynch
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Patent number: 11988708Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.Type: GrantFiled: May 16, 2023Date of Patent: May 21, 2024Assignee: Analog Devices International Unlimited CompanyInventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
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Publication number: 20240159804Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically are in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event.Type: ApplicationFiled: January 22, 2024Publication date: May 16, 2024Inventors: David J. Clarke, Stephen Denis Heffernan, Nijun Wei, Alan J. O'Donnell, Patrick Martin McGuinness, Shaun Bradley, Edward John Coyne, David Aherne, David M. Boland
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Patent number: 11940502Abstract: Aspects of this disclosure relate to one or more particles that move within a container in response to a magnetic field. A measurement circuit is configured to output an indication of the magnetic field based on position of the one or more particles.Type: GrantFiled: September 20, 2022Date of Patent: March 26, 2024Assignee: Analog Devices International Unlimited CompanyInventors: Alan J. O'Donnell, Javier Calpe Maravilla, Alfonso Berduque, Shaun Bradley, Jochen Schmitt, Jan Kubík, Stanislav Jolondcovschi, Padraig L Fitzgerald, Eoin Edward English, Gavin Patrick Cosgrave, Michael P. Lynch
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Publication number: 20240085500Abstract: Aspects of this disclosure relate to particles that can move in response to a magnetic field. A system can include a container, particles within the container, and a magnetic structure integrated with the container. The magnetic structure can magnetically interact with both an external magnetic field and the particles. Related methods are disclosed including magnetic field detection methods based on detection of particles within a container.Type: ApplicationFiled: September 6, 2023Publication date: March 14, 2024Inventors: Alan J. O'Donnell, Javier Calpe Maravilla, Shaun Bradley, Jan Kubík, Jochen Schmitt, Stanislav Jolondcovschi, Padraig L. Fitzgerald, Michael P. Lynch, Alfonso Berduque, Gavin Patrick Cosgrave, Eoin Edward English
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Publication number: 20240044725Abstract: Aspects of this disclosure relate to force based on a profile of magnetically sensitive material in a container. One or more sensors can detect the profile of the magnetically sensitive material, where the profile is associated with a force applied to the container. The profile includes magnetically sensitive material concentrated in one or more particular areas within the container. Related systems and methods for force detection are disclosed.Type: ApplicationFiled: August 2, 2023Publication date: February 8, 2024Inventors: Alan J. O'Donnell, Javier Calpe Maravilla, Jan Kubík, Jochen Schmitt, Shaun Bradley, Stanislav Jolondcovschi, Padraig L. Fitzgerald, Alfonso Berduque, Gavin Patrick Cosgrave, Michael P. Lynch, Eoin Edward English
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Publication number: 20240044726Abstract: Aspects of this disclosure relate to force based on movement of magnetically sensitive material. In embodiments, first magnetically sensitive material and second magnetically sensitive material can be in an initial position. According to such embodiments, one or more sensors to detect force based on relative position of the first magnetically sensitive material and the second magnetically sensitive in a second position. Related systems and methods for force detection are disclosed.Type: ApplicationFiled: August 2, 2023Publication date: February 8, 2024Inventors: Alan J. O'Donnell, Javier Calpe Maravilla, Jan Kubík, Jochen Schmitt, Shaun Bradley, Stanislav Jolondcovschi, Padraig L. Fitzgerald, Alfonso Berduque, Gavin Patrick Cosgrave, Michael P. Lynch, Eoin Edward English
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Publication number: 20230383855Abstract: Aspects of this disclosure relate to adjusting fluid flow using magnetically sensitive particles. Fluid can flow through an opening in a container. Magnetically sensitive particles can be confined within the container. A magnetic field can be applied to move the magnetically sensitive particles in the container to adjust flow of the fluid through the opening.Type: ApplicationFiled: May 25, 2023Publication date: November 30, 2023Inventors: Alan J. O'Donnell, Jan Kubík, Alfonso Berduque, Jochen Schmitt, Javier Calpe Maravilla, Shaun Bradley, Padraig L. Fitzgerald, Stanislav Jolondcovschi, Gavin Patrick Cosgrave, Michael P. Lynch, Eoin Edward English
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Publication number: 20230375600Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event.Type: ApplicationFiled: May 15, 2023Publication date: November 23, 2023Inventors: David J. Clarke, Stephen Denis Heffernan, Nijun Wei, Alan J. O'Donnell, Patrick Martin McGuinness, Shaun Bradley, Edward John Coyne, David Aherne, David M. Boland
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Publication number: 20230366924Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.Type: ApplicationFiled: May 16, 2023Publication date: November 16, 2023Inventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
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Publication number: 20230349987Abstract: Aspects of this disclosure relate to generating measurements based on positions of particles within one or more compartments. At least some of the particles can move in response to an external stimulus. A comparative measurement can be provided based on comparing the measurements. The measurements can be associated with two or more types of particles and/or two or more compartments.Type: ApplicationFiled: April 12, 2023Publication date: November 2, 2023Inventors: Alan J. O’Donnell, Shaun Bradley, Alfonso Berduque, Jan Kubík, Jochen Schmitt, Stanislav Jolondcovschi, Javier Calpe Maravilla, Padraig L. Fitzgerald, Gavin Patrick Cosgrave, Michael P. Lynch, Eoin Edward English