Patents by Inventor Shaun Bradley

Shaun Bradley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210088580
    Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
    Type: Application
    Filed: October 2, 2020
    Publication date: March 25, 2021
    Inventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
  • Patent number: 10917102
    Abstract: There is provided an analog signal gauge that monitors an analog signal at a node and a non-volatile memory element to store an event that occurs at the node when a certain criteria, such as exceeding a maximum safe threshold, is satisfied. This way, the analog signal gauge can help to provide an accurate picture of the operating characteristics in the analog circuit which it is monitoring, including indications of faults that occur in the analog system.
    Type: Grant
    Filed: March 18, 2019
    Date of Patent: February 9, 2021
    Assignee: Analog Devices International Unlimited Company
    Inventors: Shaun Bradley, David Aherne
  • Patent number: 10794950
    Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: October 6, 2020
    Assignee: Analog Devices Global
    Inventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
  • Publication number: 20200304134
    Abstract: There is provided an analog signal gauge that monitors an analog signal at a node and a non-volatile memory element to store an event that occurs at the node when a certain criteria, such as exceeding a maximum safe threshold, is satisfied. This way, the analog signal gauge can help to provide an accurate picture of the operating characteristics in the analog circuit which it is monitoring, including indications of faults that occur in the analog system.
    Type: Application
    Filed: March 18, 2019
    Publication date: September 24, 2020
    Inventors: Shaun Bradley, David Aherne
  • Publication number: 20190361071
    Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
    Type: Application
    Filed: July 16, 2019
    Publication date: November 28, 2019
    Inventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
  • Publication number: 20190293692
    Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event.
    Type: Application
    Filed: March 21, 2019
    Publication date: September 26, 2019
    Inventors: David J. Clarke, Stephen Denis Heffernan, Nijun Wei, Alan J. O'Donnell, Patrick Martin McGuinness, Shaun Bradley, Edward John Coyne, David Aherne, David M. Boland
  • Patent number: 10365322
    Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
    Type: Grant
    Filed: April 18, 2017
    Date of Patent: July 30, 2019
    Assignee: ANALOG DEVICES GLOBAL
    Inventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
  • Publication number: 20170299650
    Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
    Type: Application
    Filed: April 18, 2017
    Publication date: October 19, 2017
    Inventors: Edward John Coyne, Alan J. O'Donnell, Shaun Bradley, David Aherne, David Boland, Thomas G. O'Dwyer, Colm Patrick Heffernan, Kevin B. Manning, Mark Forde, David J. Clarke, Michael A. Looby
  • Publication number: 20140339020
    Abstract: The invention is an omnidirectional tree stand.
    Type: Application
    Filed: May 17, 2013
    Publication date: November 20, 2014
    Inventor: Shaun Bradley
  • Patent number: 8595532
    Abstract: Automatic power saving for decreasing power demand during a power interruption while maintaining the appearance of full operation of a signal processor including predefined power consuming circuits, a communications interface, and a state machine includes sensing when a power supply interruption has occurred, providing a clock signal, halting the clock signal to the predefined power consuming circuits during a power interruption; and continuing to provide a clock signal to a communications interface regardless of a sensed interruption for maintaining the appearance of normal operations during the sensed interruption.
    Type: Grant
    Filed: July 3, 2008
    Date of Patent: November 26, 2013
    Assignee: Analog Devices, Inc.
    Inventors: Paul P. Wright, Thomas Meany, John P. Healy, Shaun Bradley, Kieran Berney, Paul Maher
  • Patent number: 7890787
    Abstract: A microprocessor programmable clock calibration device compares, in response to a calibration command from a programmable processor, turns on a normally off reference oscillator clock, compares the frequency of the reference oscillator clock with the frequency of a calibratable oscillator clock, turns off the reference oscillator clock and adjusts, in response to a difference in those frequencies, the frequency of the calibratable oscillator clock towards that of the reference oscillator clock.
    Type: Grant
    Filed: June 15, 2006
    Date of Patent: February 15, 2011
    Assignee: Analog Devices, Inc.
    Inventors: Shaun Bradley, Kieran Heffernan, Tomas Tansley, Yang Ling
  • Publication number: 20070019770
    Abstract: A microprocessor programmable clock calibration device compares, in response to a calibration command from a programmable processor, turns on a normally off reference oscillator clock, compares the frequency of the reference oscillator clock with the frequency of a calibratable oscillator clock, turns off the reference oscillator clock and adjusts, in response to a difference in those frequencies, the frequency of the calibratable oscillator clock towards that of the reference oscillator clock.
    Type: Application
    Filed: June 15, 2006
    Publication date: January 25, 2007
    Inventors: Shaun Bradley, Kieran Heffernan, Tomas Tansley, Yang Ling