Abstract: When a data path includes CMOS circuitry, such circuitry may introduce jitter into the data signal. Embodiments are described in which additional data transitions are made to occur, and these additional data transitions may change the characteristics of the data frequency content transferred to the power supply so that such noise may be better filtered. This may have an effect of reducing jitter in the data signal. In one embodiment, a second data signal is generated to be a version of a first data signal with every second bit inverted. Second CMOS circuitry receives the second data signal in parallel to first CMOS circuitry receiving the first data signal. The first CMOS circuitry and the second CMOS circuitry are connected to a same power supply.

Abstract: When a data path includes CMOS circuitry, such circuitry may introduce into the data signal. Embodiments are described in which additional data transitions are made to occur, and these additional data transitions may change the characteristics of the data frequency content transferred to the power supply so that such noise may be better filtered. This may have an effect of reducing jitter in the data signal. In one embodiment, a second data signal is generated to be a version of a first data signal with every second bit inverted. Second CMOS circuitry receives the second data signal in parallel to first CMOS circuitry receiving the first data signal. The first CMOS circuitry and the second CMOS circuitry are connected to a same power supply.

Abstract: When a data path includes CMOS circuitry, such circuitry may introduce jitter into the data signal. Embodiments are described in which additional data transitions are made to occur, and these additional data transitions may change the characteristics of the data frequency content transferred to the power supply so that such noise may be better filtered. This may have an effect of reducing jitter in the data signal. In one embodiment, a second data signal is generated to be a version of a first data signal with every second bit inverted. Second CMOS circuitry receives the second data signal in parallel to first CMOS circuitry receiving the first data signal. The first CMOS circuitry and the second CMOS circuitry are connected to a same power supply.

Abstract: When a data path includes CMOS circuitry, such circuitry may introduce jitter into the data signal. Embodiments are described in which additional data transitions are made to occur, and these additional data transitions may change the characteristics of the data frequency content transferred to the power supply so that such noise may be better filtered. This may have an effect of reducing jitter in the data signal. In one embodiment, a second data signal is generated to be a version of a first data signal with every second bit inverted. Second CMOS circuitry receives the second data signal in parallel to first CMOS circuitry receiving the first data signal. The first CMOS circuitry and the second CMOS circuitry are connected to a same power supply.

Abstract: A sensor array, comprising: a plurality of sensors electrically connected in series or in parallel, each of the plurality of sensors operable to generate an individual electrical signal; a multiplexing scheme generator operable to generate a multiplexing scheme; a modulation system connected to the multiplexing scheme generator and operable to selectively reverse the polarity of each of the plurality of sensors for each of a plurality of samples; a readout device operable to sequentially read a plurality of output signals of the plurality of electrically connected sensors, wherein the number of samples is greater than or equal to the number of sensors and wherein one or more electrical signals of the plurality of sensors are readout as one electrical signal; and a demultiplexer operable to receive the output electrical signals and to determine the individual electrical signals of each of the plurality of sensors based on the multiplexing scheme.

Abstract: An electronic signal level detection system and method are provided. The method receives an analog input signal having a variable voltage and compares the input signal voltage to a threshold. A detection signal is generated for input signal voltages exceeding the threshold in a periodic first time frame. In a second periodic time frame (following the first time frame), a count is updated in response to the generated detection signals. The count is used to create a metric representative of the difference between the input signal voltage and the threshold. The count is incremented in response to the generating a detection signal (“1”) in the first time frame, and decremented in response to not generating a detection signal (“0”) in the first time frame.

Abstract: A sensor array, comprising: a plurality of sensors electrically connected in series or in parallel, each of the plurality of sensors operable to generate an individual electrical signal; a multiplexing scheme generator operable to generate a multiplexing scheme; a modulation system connected to the multiplexing scheme generator and operable to selectively reverse the polarity of each of the plurality of sensors for each of a plurality of samples; a readout device operable to sequentially read a plurality of output signals of the plurality of electrically connected sensors, wherein the number of samples is greater than or equal to the number of sensors and wherein one or more electrical signals of the plurality of sensors are readout as one electrical signal; and a demultiplexer operable to receive the output electrical signals and to determine the individual electrical signals of each of the plurality of sensors based on the multiplexing scheme.

Abstract: An electronic signal level detection system and method are provided. The method receives an analog input signal having a variable voltage and compares the input signal voltage to a threshold. A detection signal is generated for input signal voltages exceeding the threshold in a periodic first time frame. In a second periodic time frame (following the first time frame), a count is updated in response to the generated detection signals. The count is used to create a metric representative of the difference between the input signal voltage and the threshold. The count is incremented in response to the generating a detection signal (“1”) in the first time frame, and decremented in response to not generating a detection signal (“0”) in the first time frame.

Abstract: An electronic signal level detection system and method are provided. The method receives an analog input signal having a variable voltage and compares the input signal voltage to a threshold. A detection signal is generated for input signal voltages exceeding the threshold in a periodic first time frame. In a second periodic time frame (following the first time frame), a count is updated in response to the generated detection signals. The count is used to create a metric representative of the difference between the input signal voltage and the threshold. The count is incremented in response to the generating a detection signal (“1”) in the first time frame, and decremented in response to not generating a detection signal (“0”) in the first time frame.

Abstract: An electronic signal level detection system and method are provided. The method receives an analog input signal having a variable voltage and compares the input signal voltage to a threshold. A detection signal is generated for input signal voltages exceeding the threshold in a periodic first time frame. In a second periodic time frame (following the first time frame), a count is updated in response to the generated detection signals. The count is used to create a metric representative of the difference between the input signal voltage and the threshold. The count is incremented in response to the generating a detection signal (“1”) in the first time frame, and decremented in response to not generating a detection signal (“0”) in the first time frame.