Patents by Inventor Sheng-Lee Lin

Sheng-Lee Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrical magnetic interference test system
    Patent number: 7141962
    Abstract: An EMI (Electrical Magnetic Interference) test system is provided. The system includes a testing table, a horizontal antenna, a vertical antenna and a processing unit. The testing table is used for supporting an Equipment Under Test (EUT). The horizontal antenna is positioned at a first location in an EMI chamber. The vertical antenna is positioned at a second location in the EMI chamber. The vertical antenna and the horizontal antenna are used for receiving the electromagnetic wave radiated from the EUT, and producing a vertical electric wave and a horizontal electric wave respectively. The processing unit is coupled to the vertical antenna and the horizontal antenna for transforming and analyzing the vertical electric wave and the horizontal electric wave.
    Type: Grant
    Filed: July 13, 2005
    Date of Patent: November 28, 2006
    Assignee: Avision Inc.
    Inventors: Chin-Yuan Lin, Ming-Fang Wu, Pei-Chih Liu, Yu-Kuo Wang, Yi-Kai Lin, Sheng-Lee Lin
  • Electrical connector capable of interrupting an ESD path
    Publication number: 20060216978
    Abstract: An electrical connector, which is to be electrically connected to an electrical apparatus and capable of interrupting an ESD path, includes a body, a column and an insulation medium. The body has a through hole. The column passes through the through hole. The invention utilizes the insulation medium to encapsulate the column such that the insulation medium can contact the through hole to prevent the ESD path from passing through the through hole.
    Type: Application
    Filed: March 10, 2006
    Publication date: September 28, 2006
    Applicant: Avision Inc.
    Inventors: Chin-Yuan Lin, Yi-Kai Lin, Sheng-Lee Lin
  • Electrical magnetic interference test system
    Publication number: 20060017428
    Abstract: An EMI (Electrical Magnetic Interference) test system is provided. The system includes a testing table, a horizontal antenna, a vertical antenna and a processing unit. The testing table is used for supporting an Equipment Under Test (EUT). The horizontal antenna is positioned at a first location in an EMI chamber. The vertical antenna is positioned at a second location in the EMI chamber. The vertical antenna and the horizontal antenna are used for receiving the electromagnetic wave radiated from the EUT, and producing a vertical electric wave and a horizontal electric wave respectively. The processing unit is coupled to the vertical antenna and the horizontal antenna for transforming and analyzing the vertical electric wave and the horizontal electric wave.
    Type: Application
    Filed: July 13, 2005
    Publication date: January 26, 2006
    Inventors: Chin-Yuan Lin, Ming-Fang Wu, Pei-Chih Liu, Yu-Kuo Wang, Yi-Kai Lin, Sheng-Lee Lin