Patents by Inventor Sheng Peng Hsu

Sheng Peng Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of calibrating a test chart and a scanning device
    Patent number: 7940430
    Abstract: A method of calibrating a test chart is provided. First, a reference scanning device scans a reference test chart to obtain a plurality of reference optical density (OD) values. The reference test chart includes a plurality of reference blocks. Then, the reference scanning device scans a test chart to obtain a plurality of first OD values. The test chart includes a plurality of blocks, which corresponds to the reference blocks. Next, a compensation function derived from respectively converting the first OD values into the reference OD values is obtained.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: May 10, 2011
    Assignee: Avision Inc.
    Inventors: Ming-Hsien Hsieh, Sheng Peng Hsu, Chin Ping Yang
  • Method of calibrating a test chart and a scanning device
    Publication number: 20080030795
    Abstract: A method of calibrating a test chart is provided. First, a reference scanning device scans a reference test chart to obtain a plurality of reference optical density (OD) values. The reference test chart includes a plurality of reference blocks. Then, the reference scanning device scans a test chart to obtain a plurality of first OD values. The test chart includes a plurality of blocks, which corresponds to the reference blocks. Next, a compensation function derived from respectively converting the first OD values into the reference OD values is obtained.
    Type: Application
    Filed: August 1, 2007
    Publication date: February 7, 2008
    Inventors: Ming-Hsien Hsieh, Sheng Peng Hsu, Chin Ping Yang