Abstract: A data read/write method and device, as well as a dynamic random-access memory (DRAM) having the same are disclosed. The method may include: entering a page read/write mode configured by a reserved bit in a mode register of the DRAM; receiving a page read/write command including a page read/write enable command configured by a reserved bit in a read/write command of the DRAM; and performing a page read/write operation according to the page read/write command. This method may allow a greater amount of data to be handled by each read/write command, thereby reducing the number of required read/write commands. As a result, a higher read/write rate and lower power consumption can be achieved.

Abstract: The present disclosure provides a process variation detection circuit and a process variation detection method. The process variation detection circuit is arranged in a chip and includes: a first ring oscillator, where a first number of auxiliary elements of a preset type are arranged between two adjacent inverters of the first ring oscillator; and a second ring oscillator, where a second number of auxiliary elements of a preset type are arranged between two adjacent inverters of the second ring oscillator, the second number is larger than the first number; wherein, a number of the inverter of the first ring oscillator is the same as a number of the inverter of the second ring oscillator; a type and a size of a transistor of the first ring oscillator are the same as a type and a size of a transistor of the second ring oscillator.

Abstract: The present disclosure provides a process variation detection circuit and a process variation detection method. The process variation detection circuit is arranged in a chip and includes: a first ring oscillator, where a first number of auxiliary elements of a preset type are arranged between two adjacent inverters of the first ring oscillator; and a second ring oscillator, where a second number of auxiliary elements of a preset type are arranged between two adjacent inverters of the second ring oscillator, the second number is larger than the first number; wherein, a number of the inverter of the first ring oscillator is the same as a number of the inverter of the second ring oscillator; a type and a size of a transistor of the first ring oscillator are the same as a type and a size of a transistor of the second ring oscillator.

Abstract: The present disclosure provides a process corner detection circuit and a process corner detection method. The process corner detection circuit includes: M ring oscillators disposed inside a chip, M?1, where types of N-type transistors in the M ring oscillators are not exactly the same, and types of P-type transistors in the M ring oscillators are not exactly the same; transistor types of the M ring oscillators include all transistor types used in the chip; the ring oscillators include symmetric ring oscillators and asymmetric ring oscillators; types of N-type transistors and P-type transistors in the symmetric ring oscillators are the same; and types of N-type transistors and P-type transistors in the asymmetric ring oscillators are different.

Abstract: The present disclosure provides a process corner detection circuit and a process corner detection method. The process corner detection circuit includes: M ring oscillators disposed inside a chip, M?1, where types of N-type transistors in the M ring oscillators are not exactly the same, and types of P-type transistors in the M ring oscillators are not exactly the same; transistor types of the M ring oscillators include all transistor types used in the chip; the ring oscillators include symmetric ring oscillators and asymmetric ring oscillators; types of N-type transistors and P-type transistors in the symmetric ring oscillators are the same; and types of N-type transistors and P-type transistors in the symmetric ring oscillators are different.

Abstract: A data read/write method and device, as well as a dynamic random-access memory (DRAM) having the same are disclosed. The method may include: entering a page read/write mode configured by a reserved bit in a mode register of the DRAM; receiving a page read/write command including a page read/write enable command configured by a reserved bit in a read/write command of the DRAM; and performing a page read/write operation according to the page read/write command. This method may allow a greater amount of data to be handled by each read/write command, thereby reducing the number of required read/write commands. As a result, a higher read/write rate and lower power consumption can be achieved.