Patents by Inventor Shenghan REN

Shenghan REN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240062337
    Abstract: In a magnetic particle imaging reconstruction method based on a neural network constrained by a forward model, a system matrix is obtained through calibration, voltage data generated by a specimen is measured, collected data are transformed into a frequency-domain by Fourier transform, frequency features of data are screened by a signal-to-noise ratio threshold, a reconstruction network is built by a Pytorch to realize mapping from one-dimensional voltage data to a multi-dimensional magnetic particle concentration distribution, the system matrix is used as the forward model of magnetic particle imaging, and simulated voltage data is generated according to a reconstructed multi-dimensional magnetic particle concentration distribution, a difference between the simulated voltage data and input voltage data is calculated as a loss function for network parameter updating, a total variation regularization term is added to the loss function, and training parameters and regularization parameters are adjusted to achie
    Type: Application
    Filed: May 31, 2023
    Publication date: February 22, 2024
    Inventors: Xueli Chen, Shenghan Ren, Pengfei Huang, Duofang Chen, Hui Xie, Shouping Zhu, Jie Tian
  • Publication number: 20230177645
    Abstract: A large-field-of-view, high-throughput and high-resolution pathological section analyzer includes an image collector for collecting a set of computing microscopic images of a pathological section sample; a data preprocessing circuit for iteratively updating the set of computing microscopic images by a multi-height phase recovery algorithm to obtain a low-resolution reconstructed image; an image super-resolution circuit for super-resolving the low-resolution reconstructed image according to a pre-trained super-resolution model to obtain a high-resolution reconstructed image; and an image analysis circuit for automatically analyzing the high-resolution reconstructed image according to different tasks, and specifically selecting different analysis models according to the different tasks to obtain corresponding auxiliary diagnosis results.
    Type: Application
    Filed: February 2, 2023
    Publication date: June 8, 2023
    Inventors: Xueli CHEN, Huan KANG, Hui XIE, Duofang CHEN, Shenghan REN, Wangting ZHOU