Abstract: A processing device to be used in an inspection apparatus for optical inspection of samples is configured to be used with an optical inspection device, to be communicatively coupled to a user interface, to receive input data from the user interface and/or from the optical inspection device, and to provide output data to the user interface, and to be communicatively coupled to at least one other processing device to allow data transfer. The processing device is configured as a master unit, and the at least one other processing device is configured as a slave unit. The processing device is further configured to provide a data storage for storing data received as input and/or to be provided as output, and to allow the at least one other processing device to access the data storage to store data and/or to retrieve data.

Abstract: A processing device to be used for optical inspection of samples is configured to be communicatively coupled to a camera of an optical inspection device and to a user interface, to receive input data from the user interface and/or from the camera, to provide output data to the user interface, to be communicatively coupled to a storage device, to provide instructions, by accessing instruction data stored at the storage device, for optical quality inspection of samples to be performed by a user via the user interface. The instructions include instructions regarding what kind of optical quality inspection to be performed on which sample. The processing device is further configured to receive quality report data from the optical quality inspection via the user interface, and/or image data of images acquired by the camera, and to store the quality report data and/or the image data in the storage device.