Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: A radar system for detecting aircraft signatures is provided. The system comprises a plurality of radar clusters where each radar cluster further comprises a plurality of transmit antennas and a plurality of receive antennas. In this context, the plurality of transmit antennas and the plurality of receive antennas are co-located within each radar cluster. Furthermore, the plurality of transmit antennas are time synchronized and/or phase coherent with the plurality of receive antennas.

Abstract: A method for determining the three-dimensional alignment of components of a radar system is described. The radar system is provided that comprises at least one portion which is permeable by radar signals. The radar system is imaged by using millimeter waves emitted by an imaging system. In the image obtained, it is determined the highest magnitude reflection coinciding with at least one of an expected location and an expected distance of the surface of a first component of the radar system being of interest. At least one of the position and the distance of that surface is determined. From the measurement, the relative phase information received from each portion of that surface at the determined position and/or the determined distance is obtained. Processing the phase information obtained so as to obtain the azimuth and tilt of the surface. Further, a testing system is described.

Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: A radar system for detecting aircraft signatures is provided. The system comprises a plurality of radar clusters where each radar cluster further comprises a plurality of transmit antennas and a plurality of receive antennas. In this context, the plurality of transmit antennas and the plurality of receive antennas are co-located within each radar cluster. Furthermore, the plurality of transmit antennas are time synchronized and/or phase coherent with the plurality of receive antennas.

Abstract: A method for determining the three-dimensional alignment of components of a radar system is described. The radar system is provided that comprises at least one portion which is permeable by radar signals. The radar system is imaged by using millimeter waves emitted by an imaging system. In the image obtained, it is determined the highest magnitude reflection coinciding with at least one of an expected location and an expected distance of the surface of a first component of the radar system being of interest. At least one of the position and the distance of that surface is determined. From the measurement, the relative phase information received from each portion of that surface at the determined position and/or the determined distance is obtained. Processing the phase information obtained so as to obtain the azimuth and tilt of the surface. Further, a testing system is described.

Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: The invention relates to a technique for millimeter-wave active image reconstruction. According to a method aspect, Tx subgroups of transmitting antennas of an antenna array are established. Coherent processing of measurement data is performed for each Tx subgroup and coherent subimages are achieved. Magnitudes of complex numbers are calculated to obtain a magnitude subimage for each of the coherent subimages and an object image is generated by adding the magnitude subimages.

Abstract: The present disclosure relates to systems and methods for scanning objects and persons, for example, persons in security gates, by means of microwave radiation. Such a system includes an arrangement of several panels between which an angled walk-through passage is formed.

Abstract: The system (1) is used for the automatic calibration of an imaging-antenna arrangement (2) using an evaluation unit (4). The antenna arrangement (2) transmits signals (6) and receives the signals (6?) reflected from a calibration object (3) of known shape. The calibration object (3, 31, 32) provides at least one diffuse reflector (8). In the evaluation method, position coordinates of the calibration object (3) are entered, and the following method steps are implemented after the measurement of the reflected signals (6?): i. Calculation of the reflections of the calibration object (3, 31, 32), ii. Calculation of calibration data, iii. Preparation of an image of the calibration object with the use of the calibration data, iv. Determination of corrected position coordinates by evaluating the image of the at least one diffuse reflector, v. Implementation of steps i. to iv. with corrected position coordinates.

Abstract: The present disclosure relates to systems and methods for scanning objects and persons, for example, persons in security gates, by means of microwave radiation. Such a system includes an arrangement of several panels between which an angled walk-through passage is formed.

Abstract: A printed-circuit board arrangement electrically connects the at least one transmitter and/or receiver unit with at least one antenna element, whereas the at least one transmitter and/or receiver unit and the at least one antenna element are at least partially integrated into the printed-circuit board arrangement. In this context, the printed-circuit board arrangement includes different printed circuit boards, which are mechanically connected to one another in a rigid manner. A first part of the printed-circuit board arrangement is formed by at least one printed-circuit board, of which the substrate is made from a first material which is suitable for high-frequency, and a second part of the printed-circuit board arrangement is formed by at least one printed-circuit board, of which the substrate is made from a second material different from the first material, which is still sufficiently suitable for a low frequency and/or for a direct-voltage range.

Abstract: The invention relates to a technique for millimeter-wave active image reconstruction. According to a method aspect, Tx subgroups of transmitting antennas of an antenna array are established. Coherent processing of measurement data is performed for each Tx subgroup and coherent subimages are achieved. Magnitudes of complex numbers are calculated to obtain a magnitude subimage for each of the coherent subimages and an object image is generated by adding the magnitude subimages.

Abstract: A method for detecting structures (41, 42) such as edges and material transitions on and/or in an object (40) under investigation has an antenna arrangement which transmits microwave signals and registers the signals reflected from the object (40) under investigation in magnitude and phase. A three-dimensional image of the object (40) under investigation is reconstructed at sampling points of the object under investigation from the latter. It operates with the method steps: determination of a spatial position of a structure (41, 42) from the magnitude of the reflected signal, determination of the sign of the reflection coefficient of the reflected signal at the spatial position of the structure (41, 42), and identification of structures (41, 42) on the basis of the spatial arrangement of the sign of the reflection coefficient.

Abstract: The system is used for the automatic calibration of an imaging array using an evaluation unit. The array transmits signals and receives the signals reflected from a calibration object of known shape. The calibration object provides at least one diffuse reflector. In the evaluation method, position coordinates of the calibration object are entered, and the following method steps are implemented after the measurement of the reflected signals: (i) calculate the reflections of the calibration object, (ii) calculate calibration data, (iii) prepare an image of the calibration object with the use of the calibration data, (iv) determine corrected position coordinates by evaluating the image of the at least one diffuse reflector, and (v) implement steps (i) to (iv) with corrected position coordinates.

Abstract: The invention relates to a method for detecting a covered dielectric object, where a microwave signal that can be modified in frequency is generated at a particular bandwidth and transmitted in the direction of the covered dielectric object. The microwave signal reflected by the object is then obtained from the three-dimensional measurement result in a lateral, two-dimensional pattern, a highest signal amplitude and a second-highest signal amplitude within a particular time period before or after the received microwave signal is identified in a plurality of pattern points of the pattern. The object is detected if an accumulation of pattern points of the pattern is present, in which the difference in each case between the highest and the second highest signal amplitude of the received microwave signal is less than a defined threshold value.

Abstract: A printed-circuit board arrangement electrically connects the at least one transmitter and/or receiver unit with at least one antenna element, whereas the at least one transmitter and/or receiver unit and the at least one antenna element are at least partially integrated into the printed-circuit board arrangement. In this context, the printed-circuit board arrangement includes different printed circuit boards, which are mechanically connected to one another in a rigid manner. A first part of the printed-circuit board arrangement is formed by at least one printed-circuit board, of which the substrate is made from a first material which is suitable for high-frequency, and a second part of the printed-circuit board arrangement is formed by at least one printed-circuit board, of which the substrate is made from a second material different from the first material, which is still sufficiently suitable for a low frequency and/or for a direct-voltage range.