Abstract: Sense path and write path architectures for read and write accesses of a memory device having memory cells that store n binary bits are disclosed. “By-output” architectures provide one output per bit such that each selected memory cell is mapped to n outputs and the n bits stored in the selected memory cell are read in parallel. “By-address” architectures provide one address per bit such that each selected memory cell is mapped to one output, and the n bits stored in the selected memory cell are read sequentially.

Abstract: A method and circuitry are described that permit one to utilize a partially functional integrated circuit memory. A memory array is segregated into separate blocks that can each be isolated to minimize the amount of the memory array rendered unusable by a defect. Circuitry is also provided to program memory cells within the array to one of at least three amounts of charge and thereby increase the amount of storage provided by the remaining functional blocks.

Abstract: Sense path and write path architectures for read and write accesses of a memory device having memory cells that store n binary bits are disclosed. "By-output" architectures provide one output per bit such that each selected memory cell is mapped to n outputs and the n bits stored in the selected memory cell are read in parallel. "By-address" architectures provide one address per bit such that each selected memory cell is mapped to one output, and the n bits stored in the selected memory cell are read sequentially.

Abstract: Sense path and write path architectures for read and write accesses of a memory device having memory cells that store n binary bits are disclosed. "By-output" architectures provide one output per bit such that each selected memory cell is mapped to n outputs and the n bits stored in the selected memory cell are read in parallel. "By-address" architectures provide one address per bit such that each selected memory cell is mapped to one output, and the n bits stored in the selected memory cell are read sequentially.

Abstract: Sense path and write path architectures for read and write accesses of a memory device having memory cells that store n binary bits are disclosed. "By-output" architectures provide one output per bit such that each selected memory cell is mapped to n outputs and the n bits stored in the selected memory cell are read in parallel. "By-address" architectures provide one address per bit such that each selected memory cell is mapped to one output, and the n bits stored in the selected memory cell are read sequentially.

Abstract: Sense path and write path architectures for read and write accesses of a memory device having memory cells that store n binary bits are disclosed. "By-output" architectures provide one output per bit such that each selected memory cell is mapped to n outputs and the n bits stored in the selected memory cell are read in parallel. "By-address" architectures provide one address per bit such that each selected memory cell is mapped to one output, and the n bits stored in the selected memory cell are read sequentially.

Abstract: In a memory array in which logic signals of a first and a second voltage levels are used for selecting memory positions in the array for read operations and at least one signal of a voltage level higher than the first and second voltage levels may appear, and including a plurality of wordlines each joined to a common node by individual row decoders, a predecoder circuit for selecting a plurality of wordlines from which a row decoder may select an individual wordline including a full CMOS NAND gate arranged to provide output voltage levels of the first and a second voltage levels, a plurality of weak P channel devices each connected to one of the wordlines, means for operating the weak P channel devices to provide voltage levels of the higher level and below at the wordlines, means for limiting value of voltage transferred to the common point to be less than the higher voltage level, and means for limiting the level of the voltage transferred to the common node from the NAND gate to be less than a predetermine

Abstract: In a memory array having a plurality of bitlines each connected to a plurality of memory devices having a state in which current is transferred by the memory device and a state in which current is not transferred by the device, a column select device for activating each bitline, a plurality of wordlines for activating individual memory devices joined to each bitline, apparatus for providing constant current in the conducting state of a memory device connected to a bitline, a device connecting a source voltage to a plurality of bitlines, and a reference bitline for providing an output reference signal, the improvement including apparatus for providing a source of current in addition to current through the device connecting a source voltage to a plurality of bitlines in order to charge any capacitance of a selected bitline when that bitline is selected whereby switching between memory devices joined to different bitlines is accelerated.

Abstract: A redundancy programming circuit employing a two EPROM cell CAM for storing programmed states of redundant elements. The CAMs are disposed aside a memory array and word lines of the array are extended to the CAMs for programming the CAMs. Two word lines are coupled to each EPROM cell so that programming can still be achieved in the event one of the lines is defective.