Abstract: In one aspect, an apparatus includes: a first amplifier coupled to a first node of a receiver signal processing path, the first amplifier to receive and amplify a radio frequency (RF) signal; a first resistive attenuator coupled to the first node, the first resistive attenuator programmable to reduce a level of the RF signal; a second amplifier coupled in parallel with the first amplifier, the second amplifier to receive and amplify the RF signal; and a second attenuator coupled between the first node and the second amplifier, the second attenuator programmable to reduce the level of the RF signal.

Abstract: In one embodiment, a dual-mode power amplifier that can operate in different modes includes: a first pair of metal oxide semiconductor field effect transistors (MOSFETs) to receive and pass a constant envelope signal; a second pair of MOSFETs to receive and pass a variable envelope signal, where first terminals of the first pair of MOSFETs are coupled to first terminals of the second pair of MOSFETs, and second terminals of the first pair of MOSFETs are coupled to. second terminals of the second pair of MOSFETs; and a shared MOSFET stack coupled to the first pair of MOSFETs and the second pair of MOSFETs.

Abstract: In one embodiment, a dual-mode power amplifier that can operate in different modes includes: a first pair of metal oxide semiconductor field effect transistors (MOSFETs) to receive and pass a constant envelope signal; a second pair of MOSFETs to receive and pass a variable envelope signal, where first terminals of the first pair of MOSFETs are coupled to first terminals of the second pair of MOSFETs, and second terminals of the first pair of MOSFETs are coupled to. second terminals of the second pair of MOSFETs; and a shared MOSFET stack coupled to the first pair of MOSFETs and the second pair of MOSFETs.

Abstract: In one embodiment, a dual-mode power amplifier that can operate in different modes includes: a first pair of metal oxide semiconductor field effect transistors (MOSFETs) to receive and pass a constant envelope signal; a second pair of MOSFETs to receive and pass a variable envelope signal, where first terminals of the first pair of MOSFETs are coupled to first terminals of the second pair of MOSFETs, and second terminals of the first pair of MOSFETs are coupled to. second terminals of the second pair of MOSFETs; and a shared MOSFET stack coupled to the first pair of MOSFETs and the second pair of MOSFETs.

Abstract: In one embodiment, a dual-mode power amplifier that can operate in different modes includes: a first pair of metal oxide semiconductor field effect transistors (MOSFETs) to receive and pass a constant envelope signal; a second pair of MOSFETs to receive and pass a variable envelope signal, where first terminals of the first pair of MOSFETs are coupled to first terminals of the second pair of MOSFETs, and second terminals of the first pair of MOSFETs are coupled to. second terminals of the second pair of MOSFETs; and a shared MOSFET stack coupled to the first pair of MOSFETs and the second pair of MOSFETs.

Abstract: The present invention is directed to the use of at least one kind of inorganic pigments composed of a spherical composite particle comprising an inorganic UV filter to enhance the sun protection of a cosmetic formulation.

Abstract: A signal processing integrated circuit has having a chopper stabilized, multistage, feedforward amplifier and a delta sigma analog to digital converter. Filtering of the output of the output from the analog to digital converter comprises a sinc5 filter and a sinc3 filter. The sinc3 filter may be bypassed. A rough buffer permits quick charging of a sample and hold capacitor during part of the charge cycle and slower but more accurate charging during the remainder of the charge cycle.

Abstract: A method of testing an integrated circuit includes setting a guardbanded limit for a parameter associated with an embedded node, a deviation from the guardbanded limit under a set of test conditions correlated with a failure of the integrated circuit across a range of operating conditions. A test is performed under the test conditions to detect deviations of the parameter from the guardbanded limit to detect failures of the integrated circuit over the range of operating conditions.

Abstract: An instrumentation circuit has an integrated circuit that has input terminals, an amplifier arrangement using feed forward compensation and an analog to digital converter and a serial data output receiving the output from said amplifier arrangement. A bridge circuit, having a transducer, or a thermocouple arrangement are connected to input terminals of the integrated circuit.