Abstract: A technique for automatically identifying a semiconductor wafer (30) having bar code identification indicia (32) on the front surface (31) thereof. Reading of the code is achieved by rotating the wafer about an axis (34) perpendicular to its front surface (31); directing a beam of radiant energy (37) at the code (32) along a predetermined direction relative to the front surface (31); and sensing, while rotating the wafer, the reflected radiant energy (39) within a second predetermined angular direction relative to the front surface. The bar code used herein is preferably a modified or "stretched" bar code 39 formed on the front surface of the wafer, and having an aspect ratio (i.e., dimension of a space/dimension of a bar) ranging from 1 to 4 (FIG. 2).

Abstract: This disclosure is directed to techniques for proof testing a laminated ceramic capacitor chip (10) by placing the capacitor on a planar base (26) and applying a load thereto in a direction perpendicular to the laminations. The load is applied by a compliant ram (27) and acoustic emissions emanating from the capacitor (10) pass through the ram to a transducer (28) mounted thereon. The acoustic emissions are converted to electrical signals by the transducer (28) and are forwarded to processing circuitry (29) to compare the acoustic emission signals to previously developed signals from stressed physically acceptable capacitors (10) to determine the acceptability thereof.