Abstract: The present invention discloses an optical system for detecting a sample include a light source, one beam shaper, at least one lens, an image detecting module wherein the light source, one beam shaper, at least one lens are sequentially configured along a light path, wherein one beam shaper moves the focus along the light path back and forth so the light focused on the sample by the light source through one lens is focused onto different depths inside the sample, wherein the light source and the sample are placed at both sides of at least one lens. The image detection module is configured on a light path, and the sample is placed between at least one lens and the image detection module to capture images of different depths inside the sample.

Abstract: A single-pass optical parametric amplifier is provided. The single-pass optical parametric amplifier comprises a light source emitting a fundamental wave having a wavelength range; a nonlinear material, which the fundamental wave passes therethrough to form a second harmonic generation wave having a light path; a supercontinuum generator extending the wavelength range of the fundamental wave to form a supercontinuum generation seed; and an optical parametric wavelength transformer transforming the supercontinuum generation seed and the second harmonic generation wave into a signal wave and an idler wave.

Abstract: A single-pass optical parametric amplifier is provided. The single-pass optical parametric amplifier comprises a light source emitting a fundamental wave having a wavelength range; a nonlinear material, which the fundamental wave passes therethrough to form a second harmonic generation wave having a light path; a supercontinuum generator extending the wavelength range of the fundamental wave to form a supercontinuum generation seed; and an optical parametric wavelength transformer transforming the supercontinuum generation seed and the second harmonic generation wave into a signal wave and an idler wave.

Abstract: The present invention is a scanning system having spherical mirrors to operate a two-dimensional scanning. Aberration owing to oblique incident light is compensated to reach diffraction limit.

Abstract: The present invention is a scanning system having spherical mirrors to operate a two-dimensional scanning. Aberration owing to oblique incident light is compensated to reach diffraction limit.

Abstract: A harmonic generation microscopy employs a laser device that emits a laser beam having a predetermined wavelength that causes no autofluorescence in a biological sample and that, after excited, induces both the second and third harmonic waves. The laser beam is projected onto a sample and an observation beam from the sample is received. The observation beam is directed through a splitter to separate the second harmonic wave and the third harmonic wave both of which are then converted into corresponding electrical signals. The electrical signals are fed to a computer-based image processing equipment to form an image of the sample on the basis of the second and third harmonic waves.

Abstract: A harmonic generation microscopy employs a laser device that emits a laser beam having a predetermined wavelength that causes no autofluorescence in a biological sample and that, after excited, induces both the second and third harmonic waves. The laser beam is projected onto a sample and an observation beam from the sample is received. The observation beam is directed through a splitter to separate the second harmonic wave and the third harmonic wave both of which are then converted into corresponding electrical signals. The electrical signals are fed to a computer-based image processing equipment to form an image of the sample on the basis of the second and third harmonic waves.