Patents by Inventor Shichen Qu

Shichen Qu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12254612
    Abstract: The present disclosure belongs to the field of defect detections and discloses a method for constructing a defect detection model, a method for detecting a defect and a related apparatus, obtaining an initial training image, and adding a simulated anomaly to the initial training image to obtain a simulated anomaly training image; training a preset defect recognition model according to the initial training image and the simulated anomaly training image to obtain defect position information and mask prompt information; training a preset defect segmentation model according to the defect position information and the mask prompt information; and fusing the trained defect recognition model and defect segmentation model to obtain a defect detection model; the defect recognition model includes a teacher network branch, a student network branch and an autoencoder network branch; and an output difference between the teacher network branch and the student network branch is the defect position information.
    Type: Grant
    Filed: November 21, 2024
    Date of Patent: March 18, 2025
    Assignee: INSTITUTE OF AUTOMATION CHINESE ACADEMY OF SCIENCES
    Inventors: Xian Tao, Shichen Qu, Zhen Qu