Patents by Inventor Shien-Wang Lo

Shien-Wang Lo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for generating wafer testing program
    Patent number: 6526545
    Abstract: A method for generating a semiconductor test program is disclosed. The method is practiced by first creating a test plan according to a test key database, then take out the related parameters from the other databases in light of the test item in the test plan and creating a semiconductor test program. The semiconductor test program is attached to the wafer acceptance test (WAT) main program as a sub-program. The method for generating the auto-testing program can promote the efficiency for writing a test program and is easy to expand and maintain according to the progress of semiconductor processes.
    Type: Grant
    Filed: August 7, 2000
    Date of Patent: February 25, 2003
    Assignee: Vanguard International Semiconductor Corporation
    Inventors: Geeng-Lih Lin, Shien-Wang Lo