Patents by Inventor Shigeaki Naito

Shigeaki Naito has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card holding apparatus with probe card engagement structure
    Patent number: 8710855
    Abstract: A probe card holding apparatus is provided and may be configured to hold a probe card in a test head. The probe card may include a clamp head formed at a center part of a back surface of the probe card, and a holding device provided at the test head and configured to engage with the clamp head.
    Type: Grant
    Filed: August 1, 2011
    Date of Patent: April 29, 2014
    Assignee: Advantest Corporation
    Inventors: Katsuhiko Namiki, Shigeaki Naito
  • PROBE CARD HOLDING APPARATUS
    Publication number: 20120025858
    Abstract: A probe card holding apparatus is provided and may be configured to hold a probe card in a test head. The probe card may include a clamp head formed at a center part of a back surface of the probe card, and a holding device provided at the test head and configured to engage with the clamp head.
    Type: Application
    Filed: August 1, 2011
    Publication date: February 2, 2012
    Applicant: ADVANTEST CORPORATION
    Inventors: Katsuhiko NAMIKI, Shigeaki NAITO
  • Electronic device test apparatus and method of mounting of performance board in electronic device test apparatus
    Patent number: 8013624
    Abstract: An electronic device test apparatus comprising: a test apparatus body for testing IC devices formed on a wafer for electrical characteristics; a probe card for electrically connecting the IC devices and the test apparatus body; a prober for pushing the wafer against the probe card so as to electrically connect the IC devices and the probe card; an abutting mechanism extending toward the back surface of the probe card and abutting against the back surface of the probe card; and a lock mechanism fixing the extension of the abutting mechanism in the state with the abutting mechanism abutting against the back surface of the probe card.
    Type: Grant
    Filed: March 10, 2006
    Date of Patent: September 6, 2011
    Assignee: Advantest Corporation
    Inventors: Katsuhiko Namiki, Shigeaki Naito
  • Electronic Device Test Apparatus and Method of Mounting of Performance Board in Electronic Device Test Apparatus
    Publication number: 20090237100
    Abstract: An electronic device test apparatus comprising: a test apparatus body for testing IC devices formed on a wafer for electrical characteristics; a probe card for electrically connecting the IC devices and the test apparatus body; a prober for pushing the wafer against the probe card so as to electrically connect the IC devices and the probe card; an abutting mechanism extending toward the back surface of the probe card and abutting against the back surface of the probe card; and a lock mechanism fixing the extension of the abutting mechanism in the state with the abutting mechanism abutting against the back surface of the probe card.
    Type: Application
    Filed: March 10, 2006
    Publication date: September 24, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: Katsuhiko Namiki, Shigeaki Naito