Abstract: A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1?0.1?n2?n1+0.1 holds where n2 is a refractive index of the enclosure portion, and n1 is a refractive index of the device under test. Further, the first flat surface portion intersects with a travel direction of the terahertz wave at the right angle.

Abstract: Fixtures according to the present invention include fixing surfaces in the same shape as end surfaces of a device under test which is to be measured while an electromagnetic wave to be measured at a frequency equal to more than 0.01 [THz] and equal to or less than 100 [THz] is irradiated on the device under test. The end surfaces are fixed to the fixing surfaces. When a refractive index of the fixtures is n0, and a refractive index of the device under test is n1, a relationship n1?0.1?n0?n1+0.1 holds. The fixtures do not cover a side surface of the device under test. The fixtures are rotated about a straight line orthogonal to the fixing surfaces as a rotational axis.

Abstract: Fixtures according to the present invention include fixing surfaces in the same shape as end surfaces of a device under test which is to be measured while an electromagnetic wave to be measured at a frequency equal to more than 0.01 [THz] and equal to or less than 100 [THz] is irradiated on the device under test. The end surfaces are fixed to the fixing surfaces. When a refractive index of the fixtures is n0, and a refractive index of the device under test is n1, a relationship n1?0.1?n0?n1+0.1 holds. The fixtures do not cover a side surface of the device under test. The fixtures are rotated about a straight line orthogonal to the fixing surfaces as a rotational axis.

Abstract: A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1?0.1?n2?n1+0.1 holds where n2 is a refractive index of the enclosure portion, and n1 is a refractive index of the device under test. Further, the first flat surface portion intersects with a travel direction of the terahertz wave at the right angle.