Abstract: When electrically connecting a second electrode layer and a pixel electrode through a plug electrode provided in a hole of an interlayer insulation film, the plug electrode is formed in such a manner as to fill the contact hole formed in the first insulation film, and then a second insulation film is formed. Then, the second insulation film is polished from the surface side to expose the plug electrode, and thereafter a pixel electrode is formed on the surface side of the second insulation film.

Abstract: An electrooptic apparatus substrate and examination method therefor can be provided which can implement an examination without requiring bringing a probe into contact thereto from the outside and with satisfactory measuring accuracy. A substrate 1 of the present invention includes a video line 7 and transmission date portion 6 through multiple switching elements for writing a first potential signal in multiple pixels through a signal line. The substrate 1 further includes a display data reading circuit portion 4 having a differential amplifier 4a for lowering a lower potential and heightening a higher potential and outputting it to the signal line and a transmission gate portion 6 and video line 7 for reading the first potential signal and a reference second potential signal.

Abstract: An electrooptic apparatus substrate and examination method therefor can be provided which can implement an examination without requiring bringing a probe into contact thereto from the outside and with satisfactory measuring accuracy. A substrate 1 of the present invention includes a video line 7 and transmission gate portion 6 through multiple switching elements for writing a first potential signal in multiple pixels through a signal line. The substrate 1 further includes a display data reading circuit portion 4 having a differential amplifier 4a for lowering a lower potential and heightening a higher potential and outputting it to the signal line and a transmission gate port on 6 and video line 7 for reading the first potential signal and a reference second potential signal.